Over the past year or so there has been a lot of discussion of mixed-mode s-parameters, why they are useful, conversion of single-ended to mixed mode, etc., etc.... As I understand it, mixed-mode s-parameters can be mesasured with a true pure-mode VNA, with a 4-port VNA, or with a TDR (the last 2 methods requiring mathematical post-processing of the measured data to create mixed-mode s-parameter data). This post processing can occur either in the instrument (with appropriate firmware) or after the fact in a separate compute environment. Is it true that a true pure-mode VNA is still not available commercially from any of the test equipment vendors? I wonder if anyone knowledgable on the topic can comment in the practical differences a user should be aware of when utilizing a 4-port VNA to measure mixed mode s-parameters as opposed to the fabled pure-mode instrument. -Ray -- Raymond Anderson Senior Signal Integrity Staff Engineer Product Technology Dept. Package Engineering Group Xilinx Inc. ------------------------------------------------------------------ To unsubscribe from si-list: si-list-request@xxxxxxxxxxxxx with 'unsubscribe' in the Subject field or to administer your membership from a web page, go to: //www.freelists.org/webpage/si-list For help: si-list-request@xxxxxxxxxxxxx with 'help' in the Subject field List FAQ wiki page is located at: http://si-list.org/wiki/wiki.pl?Si-List_FAQ List technical documents are available at: http://www.si-list.org List archives are viewable at: //www.freelists.org/archives/si-list or at our remote archives: http://groups.yahoo.com/group/si-list/messages Old (prior to June 6, 2001) list archives are viewable at: http://www.qsl.net/wb6tpu