Eugene, I wanted to let you know that there will soon be a 3rd option for validating signals on a DDR2 interface. LeCroy will be introducing a DDR2 compliance testing package next month that you might want to check out. It will support measurement of the full parameter set. Our solution uses long waveform captures to speed up the time to gather large numbers of samples of each parameter. Best Regards, Jim James J Mueller LeCroy Corporation |------------> | From: | |------------> >--------------------------------------------------------------------------------------------------------------------------------------------------| |Eugene Ivanov <eugene.ivanov@xxxxxxx> | >--------------------------------------------------------------------------------------------------------------------------------------------------| |------------> | To: | |------------> >--------------------------------------------------------------------------------------------------------------------------------------------------| |"si-list@xxxxxxxxxxxxx" <si-list@xxxxxxxxxxxxx> | >--------------------------------------------------------------------------------------------------------------------------------------------------| |------------> | Date: | |------------> >--------------------------------------------------------------------------------------------------------------------------------------------------| |04/17/2009 12:08 AM | >--------------------------------------------------------------------------------------------------------------------------------------------------| |------------> | Subject: | |------------> >--------------------------------------------------------------------------------------------------------------------------------------------------| |[SI-LIST] Pros/Cons of Agilent vs Tek scope for DDR2/DDR3 characterization | >--------------------------------------------------------------------------------------------------------------------------------------------------| |------------> | Sent by: | |------------> >--------------------------------------------------------------------------------------------------------------------------------------------------| |si-list-bounce@xxxxxxxxxxxxx | >--------------------------------------------------------------------------------------------------------------------------------------------------| Need to make a selection of which scope to buy for DDR2/3 i/f JEDEC compliance testing on the memory controller(s). I personally like Tek scope but it is more expensive and its DDR compliance test software doesn't support all the required parameters. Did anybody evaluate both scopes for this application and which one you picked? What were pros/cons to go with Tek vs Agilent or vice versa? Thanks in advance ------------------------------------------------------------------ To unsubscribe from si-list: si-list-request@xxxxxxxxxxxxx with 'unsubscribe' in the Subject field or to administer your membership from a web page, go to: //www.freelists.org/webpage/si-list For help: si-list-request@xxxxxxxxxxxxx with 'help' in the Subject field List technical documents are available at: http://www.si-list.net List archives are viewable at: //www.freelists.org/archives/si-list or at our remote archives: http://groups.yahoo.com/group/si-list/messages Old (prior to June 6, 2001) list archives are viewable at: http://www.qsl.net/wb6tpu ------------------------------------------------------------------ To unsubscribe from si-list: si-list-request@xxxxxxxxxxxxx with 'unsubscribe' in the Subject field or to administer your membership from a web page, go to: //www.freelists.org/webpage/si-list For help: si-list-request@xxxxxxxxxxxxx with 'help' in the Subject field List technical documents are available at: http://www.si-list.net List archives are viewable at: //www.freelists.org/archives/si-list or at our remote archives: http://groups.yahoo.com/group/si-list/messages Old (prior to June 6, 2001) list archives are viewable at: http://www.qsl.net/wb6tpu