[SI-LIST] IEEE-EMCS Santa Clara Valley Chapter Meeting on Tuesday April 12th

From: Ahmad Fallah <emcesd2000@xxxxxxxxx>
To: si-list@xxxxxxxxxxxxx
Date: Fri, 8 Apr 2005 01:38:36 -0700 (PDT)
Hello all, 
Please join us for the monthly meeting of the IEEE-EMCS SCV Chapter on Tuesday 
April 12, 2005.  The presentation topics are excellent, and the speaker (Dr. 
Pommerenke) is magnetic.  Food and beverages are also provided.

The meeting will start at 5:30 PM with a social, and is followed by TWO 
presentations on the topics of EMI analysis of complex systems and ESD.  As 
always, we will have potential position opening announcements in the field of 
EMC and SI before the meeting is called to order.  

Below, please find the meeting announcement and a brief bio of the speaker. A 
copy of this month's newsletter, Spectral Lines, can be downloaded from 
http://www.scvemc.org/sl-apr2005.pdf.


IEEE/EMC Society Santa Clara Valley Chapter Meeting
April 12, 2005


Time:      Social 5:30 p.m.  Presentation 7:00 p.m. 

Place:     Applied Materials Bowers Cafeteria
                   3090 Bowers Ave., Santa Clara, CA 95051-0804

Subject:        " Part I: EMI Analysis of complex systems, Part II 
Electrostatic Discharge - It failed! 
                H! ow to find the root cause!"
    
Speaker:  Dr. David Pommerenke

Part I: EMI Analysis of complex systems
Many methods and tools exist for the analysis of EMI of complex systems. 
Examples are different probing methods, time domain data analysis, frequency 
domain data analysis at different bandwidths and the methods that fall between 
time and frequency domain, such as zero span spectrum analysis and 
Joint-Time-Frequency Analysis techniques such as Short Term FFT and wavelet 
analysis.

This talk will show the application of different data analysis techniques for 
complex systems. Special emphasis is given on explaining the methods and on 
showing when which method provides the better inside, not on promoting one or 
the other method.

Part II: Electrostatic Discharge - It failed! How to find the root cause!
Assume a system has failed an ESD test. Of course, one could improve shielding 
but isn't it better to exactly understand which electrical net or IC had been 
affected and, consequently, just apply a small change to the board or software?

The talk explains methods on how to find the root cause of ESD failures by 
systematic local injection and how to probe signals with GHz bandwidth, while 
applying ESD to the system. It will show examples systems that experienced ESD 
failures that have been located using this technique. Further, it will discuss 
how IC-level EMC will influence ESD design.

Speaker Bio:
David Pommerenke is associated professor at the EMC laboratory at UMR. Dr. 
Pommerenke's speciality is the combination of electronics and electromagnetics. 
Such problems can be found in intentional or unintentional disturbances of 
circuits, Signal Integrity of fast networks and other situations in which the 
circuit behavior is dominated by "everything that is not on the circuit diagr! 
am". His interests are: EMC, ESD, Electronics, Signal Integrity, measurement 
instrumentations and testing. Before joining UMR he worked as EMC Engineer at 
HP for five years. He is member of the ESD standard setting group within IEC 
TC77b.

Hope to see you all at this educational meeting.

Kind Regards,
Oscar Fallah
Secretary, IEEE-EMCS SCV Chapter
IEEE-EMCS ESAC, Student EMC Design Competition


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[SI-LIST] IEEE-EMCS Santa Clara Valley Chapter Meeting on Tuesday April 12th

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