[SI-LIST] I am focusing on IC level ESD soft error qualification. And now I am working on field coupled IC evaluation, is there any comparison and suggestion on field coupled evaluation methods?

From: luyi <issue.lu@xxxxxxxxxxx>
To: "si-list@xxxxxxxxxxxxx" <si-list@xxxxxxxxxxxxx>
Date: Wed, 9 Jul 2014 07:56:16 +0000

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[SI-LIST] I am focusing on IC level ESD soft error qualification. And now I am working on field coupled IC evaluation, is there any comparison and suggestion on field coupled evaluation methods?

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