[SI-LIST] Re: How to simulate worse case eye

  • From: Vinu Arumugham <vinu@xxxxxxxxx>
  • Date: Mon, 09 Mar 2009 10:09:34 -0700

StatEye now directly imports step responses (www.stateye.org). One could 
configure the HSPICE netlist to generate this step response. The 
statistical eye is calculated based on LTI assumption. As far as I know 
8b10b is not supported but the results are applicable to 64/66 or 
similar scrambler based systems.
Thanks,
Vinu



Dmitriev-Zdorov, Vladimir wrote:
> Tim/Joel,
> Perhaps, I should have given more details in my previous reply.
>
> Yes, the paper of Brian Casper, and even some earlier works give us a method 
> of building an unconstrained worst case pattern; that is relatively simple. I 
> would also recommend reading this paper as an excellent introduction into the 
> topic.
>
> However, this approach does not answer all practical needs, including the 
> following.
>
> 1.    Encoded worst case pattern. In many important cases the unconstrained 
> worst case solution does not have much value. If e.g. the SERDES channel 
> includes series capacitor(s), we know that the eye will be closed by 
> sufficiently long series of logical 'ones' or 'zeros'. The longer is a series 
> of identical bits, the more closed the eye becomes. In this sense, there is 
> no 'worst' unconstrained solution, unless the pattern length is limited. Of 
> course, in such channels only encoded binary inputs are allowed (8b10b or 
> some others), with their imparity and running length constraints, for which 
> the idea of 'worst case pattern' makes a perfect sense. There exists a 
> solution for such case in HL.
> 2.    Some types of non-LTI behavior. For example, in many cases the 
> responses to rising and falling transitions are not symmetrical, that means 
> their sum R(t) + F(t) is not identical constant. There are several sources of 
> this phenomenon: (a) persistent time shift between R/F transitions (DCD), (b) 
> asymmetry of PU and PD I-V or timing characteristics in a single ended 
> channel, or (c) partial conversion of near end common signal into far end 
> differential signal, that may occur even with identical differential buffers, 
> if linear part of the channel is not ideally symmetric (creates differential 
> skew).
>
> In the recent Mentor/Tek paper "New methods of measuring the performance of 
> equalized serial data links and correlation of performance measures across 
> the design flow..." from DesignCon2009 we considered worst case solutions, 
> including cases (1), (2) and combination of (1) and (2).
>
>
>
>
>
>
>
>
>
>
>
>   
>>
>>
>>     
>
>
> Joel,
>
> I'm sure there will be no shortage of recommendations here, but here's
> my contribution:
>
> It's pretty easy to determine the worst case pattern for a single route,
> assuming the system is linear-time-invariant.
>
> 1. Start by generating the pulse response of the system.
>
> 2. Then sample the response at UI intervals from the Peak or cursor
> sample, or just eyeball the ISI at these intervals.
>
> 3. Based on the direction or polarity of the ISI terms, and their
> relative distances from the cursor (in UI), you can determine what input
> pattern can be used to maximize the combined contributions of the ISI
> terms. Positive-going ISI terms eat away from the nominal zero level,
> and negative-going ISI terms eat away from the nominal one level.
>
> 4. You can then move your cursor away from the peak of the pulse
> response and repeat the process to determine patterns targeting points
> across the width of the eye if desired.
>
>
> If you haven't read it, check out Bryan Casper's paper describing the
> use of Peak Distortion analysis to generate Worst Case Eyes. It doesn't
> explicitly tell you how to generate the worst case pattern, but it may
> inspire you.
>
> B.K. Casper, et al, "An accurate and efficient analysis method for
> multi-Gb/s chip-to-chip signaling schemes."
>
> If you've got IEEE access:
> http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber15043&isnumber!8
> 31 
>
>
> Tim Hollis
> DRAM Design
> Micron Technology, Inc.
>
>
>
> -----Original Message-----
> From: si-list-bounce@xxxxxxxxxxxxx [mailto:si-list-bounce@xxxxxxxxxxxxx]
> On Behalf Of Joel Brown
> Sent: Friday, March 06, 2009 3:35 PM
> To: SI-LIST@xxxxxxxxxxxxx
> Subject: [SI-LIST] How to simulate worse case eye
>
> I was watching a webinar by Mentor on Hyperlynx and how they can quickly
> generate a prbs pattern that results in a worse case eye diagram. They
> said
> without this feature it could take days or even years of simulation to
> do
> this.
> I do most of my simulation in hspice since most of my models are based
> in
> Hspice.
>
> Is there a way to do what Mentor is claiming in Hspice by generating a
> certain pattern?
>
> I have been using the following code for a prbs sequence:
>
>  
>
> vin inr vcm LFSR(0.1 -0.1 1n 5ps 5ps 
>
> + 'data_rate' 1 [7,4,1] rout=0)
>
> vinn innr vcm LFSR(-0.1 0.1 1n 5ps 5ps 
>
> + 'data_rate' 1 [7,4,1] rout=0)
>
>  
>
> Thanks - Joel
>
>
>  
>
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