A few notes: * When measuring the VDD to VSS capacitance without bias, be aware that all the on-chip circuitry connected to the power lines will also present a significant capacitance. Of course it depends upon the size of the circuit but there could be a few hundred pF from the circuit itself. However, you are most likely not interested in measuring the capacitance with 1% accuracy but rather want to know approximately how much is there (20~50% accuracy). For this purpose the measurement without bias is good. To be effective, the decoupling capacitance needs to be a lot bigger than the circuit capacitance anyway. * When measuring capacitance you are injecting a test signal. Make sure this test signal does not affect the circuits other than the capacitance. When measuring without bias you want to stay below 0.4Vpp to not open any diodes in the circuit that will affect the test result. This could for example be a reason for an unstable reading. Most network analyzers will default test with 0dBm signal level, which would be too much. Lower the signal level to at least -10dBm. Theoretically the capacitance value should not be dependent upon signal level so you could try at different levels and determine for yourself how low your test signal level needs to be for a stable result. * The fact that the chip needs on-chip power supply decoupling means that there are signals inside the chip that might interfere with the power lines. When you apply bias the circuit becomes "alive" and signals from the chip might interfere with your capacitance test signals. This may be another reason for an unstable test result. If possible put the chip in a sleep mode or powered down mode so there can be no other signals than your test signal on the power lines. When powering up only an I/O power pin it might be OK but there can still be diodes between the I/O power line and other power lines so you could still be partly powering other circuits. * Capacitance meters can have a bias setting but usually this is not strong enough to power a chip. Make sure that when you set for example Bias=1.8V that the DC voltage on your chip is actually going up to 1.8V. * To minimize the influence from bond wires and other leadframe parasitic inductance you can use a low test frequency like 10MHz or perhaps as low as 1MHz. The lower the test frequency, the smaller the error in your capacitance test from parasitic inductance. * When one node for your test probe or test signal is the ground plane then you can use S11. The VSS of your chip is most likely connected to the ground plane. When you need to do a differential test between two nodes then I would recommend S12 (or S21). Most network analyzers have built in functionality to convert S parameters to impedance. * Before hooking up your test system and test methods to the chip, first verify with a known capacitor that your method is working OK. Take for example a 1000pF (1nF) capacitor and verify that your equipment is indeed measuring something close to 1000pF. It can save you a lot of trouble and a lot of time to first make sure that your test method is OK. I hope these notes will help you getting good test results for the on-chip decoupling capacitance. ;-) Eddy van Keulen Sr Applications Eng. Mgr. PhaseLink Corp. San Jose, CA - USA --- On Fri, 9/10/10, yardala <yardala@xxxxxxxxx> wrote: From: yardala <yardala@xxxxxxxxx> Subject: [SI-LIST] How to measure the On Die decupling capacitor value ? To: si-list@xxxxxxxxxxxxx Date: Friday, September 10, 2010, 7:15 PM Hi, All Can I measure the value of On Die Decoupling capacitor use only capacitor meter probing at pin Vdd and Vss ? When I use meter to measure the value of core logic are few nH and unstable, the value of I/O power are several hundred pF. Does these value make sense ? does it good enough , or any other methods are suggest ? Does the bonding wire effect the capacitor value ? Thanks! Yardala ------------------------------------------------------------------ To unsubscribe from si-list: si-list-request@xxxxxxxxxxxxx with 'unsubscribe' in the Subject field or to administer your membership from a web page, go to: //www.freelists.org/webpage/si-list For help: si-list-request@xxxxxxxxxxxxx with 'help' in the Subject field List technical documents are available at: http://www.si-list.net List archives are viewable at: //www.freelists.org/archives/si-list Old (prior to June 6, 2001) list archives are viewable at: http://www.qsl.net/wb6tpu ------------------------------------------------------------------ To unsubscribe from si-list: si-list-request@xxxxxxxxxxxxx with 'unsubscribe' in the Subject field or to administer your membership from a web page, go to: //www.freelists.org/webpage/si-list For help: si-list-request@xxxxxxxxxxxxx with 'help' in the Subject field List technical documents are available at: http://www.si-list.net List archives are viewable at: //www.freelists.org/archives/si-list Old (prior to June 6, 2001) list archives are viewable at: http://www.qsl.net/wb6tpu