[SI-LIST] Re: [Fwd: [IBIS-Users] static/dynamic overshoot/undershoot definition]
- From: Perry Qu <perry.qu@xxxxxxxxxxx>
- To: "Beal, Weston" <weston_beal@xxxxxxxxxxx>
- Date: Mon, 22 Sep 2003 14:28:36 -0400
Hi, Weston, Fred:
Thanks very much for your answer. Obviously I did not read the IBIS 3.2 spec
line by line. :)
Checked the particular model I have and it specified static/dynamic
overshoot/undershoot value but there is no mention of SI/timing location. Need
to ask vendor.
Regards
Perry
"Beal, Weston" wrote:
> Perry,
>
> Since this is a noise issue, the location of measurement should be determined
> by Si_locaton, a sub-parameter of [Component]. The value can be "Pin" or
> "Die". If this sub-parameter is not specified then the EDA tool will make
> some assumption so the answer to your question is specific to the tool that
> you use. The tools that I'm familiar with assume "Pin" for most simulations.
>
> Regards,
> Weston
>
> -----Original Message-----
> From: Perry Qu [mailto:perry.qu@xxxxxxxxxxx]
> Sent: Monday, September 22, 2003 10:18 AM
> To: si-list
> Subject: [SI-LIST] [Fwd: [IBIS-Users] static/dynamic
> overshoot/undershoot definition]
>
> Hi,
>
> Post this to IBIS reflector and did not get any response. Anyone can
> help me to clarify this ?
>
> Thanks
>
> Perry
>
> -------- Original Message --------
> Subject: [IBIS-Users] static/dynamic overshoot/undershoot definition
> Date: Fri, 19 Sep 2003 09:06:13 -0400
> From: Perry Qu <perry.qu@xxxxxxxxxxx>
> Organization: Alcatel Canada
> To: IBIS group <ibis-users@xxxxxxx>
>
> Hi,
>
> Can someone let me know in IBIS spec, where the static/dynamic
> overshoot/undershoot is defined ? At packaging pins or at die ?
>
> Thanks
>
> Perry
>
> --
> Perry Qu
>
> Design & Qualification | 600 March Road
> Alcatel Canada | Ottawa, ON K2K 2E6, Canada
>
> DID: (613) 7846720 | FAX: (613) 5993642
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--
Perry Qu
Design & Qualification | 600 March Road
Alcatel Canada | Ottawa, ON K2K 2E6, Canada
DID: (613) 7846720 | FAX: (613) 5993642
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