[SI-LIST] Re: Failed Tantalum capacitors - package hermeticity compromised
- From: "Curt McNamara" <curt.mcnamara@xxxxxxxxxxx>
- To: "Salkow, Steven" <steven.salkow@xxxxxxxx>, <si-list@xxxxxxxxxxxxx>
- Date: Tue, 27 Jan 2009 10:29:13 -0600
Another factor is in-rush current. If the voltage does not rise slowly but is
connected
to a supply which is already active, the voltage rise time can be very fast,
and the in-rush current
enough to damage the parts. I have several examples of this here.
Curt
Curt McNamara, P.E. // principal electrical engineer
Logic Product Development
411 Washington Ave. N. Suite 400
Minneapolis, MN 55401
T // 612.436.5178
F // 612.672.9489
www.logicpd.com
/ / / / / / / / / / / / / / / / / / / / / / / / /
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From: si-list-bounce@xxxxxxxxxxxxx [mailto:si-list-bounce@xxxxxxxxxxxxx] On
Behalf Of Salkow, Steven
Sent: Monday, January 26, 2009 7:40 PM
To: si-list@xxxxxxxxxxxxx
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Subject: [SI-LIST] Failed Tantalum capacitors - package hermeticity compromised
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Recently we have had some tantalum capacitors rated at 16V fail on turn
of in a 12V circuit. While some percentage of low ESR capacitors
experience a high surge infant mortality on first turn on unless
serrated by 50% or more, these capacitor were sent for additional
electrical screening at an independent test house.
Just as a precaution we decided to also sample test the lot for package
hermeticity by conducting a bubble test. 25 samples were picked at
random from the lot of 450 and 100% of these failed bubble test.
Has anyone had this problem before? Has any had counterfeit capacitors?
Steven Salkow
Lockheed IS&S
3130 Zanker Rd, San Jose
Ca. 95134
(408) 473-4058
H: (925) 462-1075
steven.salkow@xxxxxxxx
salkow@xxxxxxxxxxxx
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