[SI-LIST] Re: Eye diagram measurement - And leaves your teeth Shiny White Too!
- From: Yafei Bi <yafei_bi@xxxxxxxxx>
- To: gary_pratt@xxxxxxxxxxx, si-list@xxxxxxxxxxxxx
- Date: Wed, 6 Apr 2005 11:42:27 -0700 (PDT)
Logic designer/verification engineers have been doing
self-checking for a long time.
For analog/circuit designer, self-checking or post
processing has been a pain exercise sometimes until
AMS comes in. of course you can rely on the built-in
functions from waveform viewer.
As Gary mentioned, all the post simulation measurement
or checking can be done with an simple AMS model
plugged into your simulation deck.
In my work, I have written a lot of AMS modules to
just to do measurement and post processing stuff. That
saves me a lot of time and I don't have to check every
waveforms/signals in the simulation in terms of timing
and amplitude etc.
Glad Gary brought this up.
Thanks
Yafei
--- "Pratt, Gary" <gary_pratt@xxxxxxxxxxx> wrote:
> Of course, automated measurements is another benefit
> to AMS that hasn't
> received a lot of attention on the list. Creating
> an AMS receiver model
> that outputs eye measurements would be a very
> straightforward task.
> Actually, the device wouldn't have to be in the
> receiver, it could be
> attached anywhere in the circuit using [external
> circuit] in a "macro"
> fashion. =20
>
> The model would do its calculations during the
> simulation providing
> incremental data during the simulation, and the
> final results
> immediately at the end of the simulation. Watching
> the results progress
> towards and asymptote may provide a feel for
> adequacy of coverage and
> simulation time requirements. Consisting of mostly
> sequential coding
> (which is partitioned to the event-driven solver),
> the measurement would
> have minimal impact on the overall simulation time.
> =20
>
>
>
> -----Original Message-----
> From: si-list-bounce@xxxxxxxxxxxxx
> [mailto:si-list-bounce@xxxxxxxxxxxxx]
> On Behalf Of Scott McMorrow
> Sent: Wednesday, April 06, 2005 10:22 AM
> To: Jim Antonellis
> Cc: edpc108@xxxxxxxxx; si-list@xxxxxxxxxxxxx
> Subject: [SI-LIST] Re: Eye diagram measurement
>
> The trick is one set of measure statements to cover
> each bit cell, which
> results in 100's, 1000's or 10000's of measure
> statements for an entire
> simulated data stream. It can be done and
> implemented with a script
> that parses the excitation pattern, and then
> processes all of the
> measurement results. It is not pretty. It is an
> exceedingly slow post
> processing operation in HSPICE, when the time
> resolution is down in the
> 1ps range. Which is why other external waveform
> processing, as is done
> in the SiSoft tools, is more desireable.
> scott
>
> Scott McMorrow
> Teraspeed Consulting Group LLC
> 121 North River Drive
> Narragansett, RI 02882
> (401) 284-1827 Business
> (401) 284-1840 Fax
>
> http://www.teraspeed.com
>
> Teraspeed(r) is the registered service mark of
> Teraspeed Consulting
> Group LLC
>
>
>
> Jim Antonellis wrote:
>
> >Hi Scott, Jaaprakash,
> >
> >I looked into this a while back, and I thought
> using the HSPICE=20
> >.MEASURE construct you did not have the ability to
> make multiple bit=20
> >cell measurements. Could you please share the
> .MEASURE syntax that=20
> >would make this possible as I had to resort to a
> post-proc spreadsheet=20
> >last time I did it.... and would greatfully
> appreciate the "trick".
> >
> >Thx,
> >Jim
> >
> >
> >-
> >Jim Antonellis janton@xxxxxxxxxxxxx
> >Sandburst Corp www.sandburst.com
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> >Cell: 978.618.4745
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> >
> >-----Original Message-----
> >From: si-list-bounce@xxxxxxxxxxxxx
> >[mailto:si-list-bounce@xxxxxxxxxxxxx]On Behalf Of
> Scott McMorrow
> >Sent: Wednesday, April 06, 2005 11:12 AM
> >To: edpc108@xxxxxxxxx
> >Cc: si-list@xxxxxxxxxxxxx
> >Subject: [SI-LIST] Re: Eye diagram measurement
> >
> >
> >Jaaprakash,
> >
> >Yes. It can be done with .measure statements, or
> it can be done with=20
> >SiSoft's SiAuditor measurement capability.
> >
> >scott
> >
> >Scott McMorrow
> >Teraspeed Consulting Group LLC
> >121 North River Drive
> >Narragansett, RI 02882
> >(401) 284-1827 Business
> >(401) 284-1840 Fax
> >
> >http://www.teraspeed.com
> >
> >Teraspeed(r) is the registered service mark of
> Teraspeed Consulting
> Group=20
> >LLC
> >
> >
> >
> >Jayaprakash wrote:
> >
> > =20
> >
> >>Hi ,
> >>
> >> Is it possible to measure eye diagram height and
> width (not=20
> >>graphically) in HSPICE simulations?
> >>
> >> Thanks,
> >>
> >>Best regards,
> >> Jayaprakash.
> >>
> >>
> >>
> >>Send instant messages to your online friends=20
> >>http://uk.messenger.yahoo.com
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