HI All, We have the following positions currently open in our Company, interested candidate Please email me at vivekamp@xxxxxxxxxxxxxx 1)Principal Signal Integrity Engineer Requirements: 5 to 7 years working in a high-tech environment with at least 3+ of those years in Signal Integrity analysis and development, working with a cross functional group. BS/MS in Electrical Engineering is required Self-motivated with the ability to work well with others in a team environment Experience with signal integrity design with emphasis on power distribution at a system level in PCB and/ or packaging, Experience with 3D modeling tools as well as spice simulation tools Experience with laboratory measurements using equipment such as oscilloscopes, vector network analyzers, spectrum analyzers and time domain reflectometers Excellent analytical, design, and debug skills Able to travel within Asia at relatively short notice. Good verbal and written communication skills Senior/ Engineer, Electrical Design (Fresh graduates welcome) Responsibilities: * Custom design of Advanced Probe Cards for wafer level testing based on MEMS technology. * Execute the feasibility analysis of a new probe card design and prepare report for customer feedback in a timely manner * Responsible for the overall design schedule to ensure on-time delivery while maintaining good design quality * Interact with various local and international engineering departments * Contribute to design process improvement activities * Participate in CAD tool development * Train other Engineers in the design process using commercial and/or internal CAD tools Requirements: * Masters/Bachelor's Degree in Electrical/Electronics Engineering or equivalent * Experience in probe card design or application is preferred * Fresh graduates are welcome to apply * Candidates with related experience in hardware board level design, test interface design, semiconductor test or semiconductor product engineering-related field will have an advantage * Knowledge in Signal Integrity and high speed design * Experience in AutoCAD drafting and MS Excel * Basic programming skill and/or Visual Basic scripting in MS Excel are an added advantage * Must be able to accomplish project turnaround within tight deadline * Fluent in English Company Overview FormFactor is the leader in advanced wafer probe cards, which are used by semiconductor manufacturers to electrically test integrated circuits (ICs) while they are still on the wafer. The company's wafer sort, burn-in and device performance testing products move IC testing upstream from post-packaging to the wafer level, enabling semiconductor manufacturers to bring next-generation devices to market faster while reducing their overall cost of test and improving their yields. FormFactor Transforming Test FormFactor's advanced wafer probe card solutions help semiconductor manufacturers overcome these challenges and accelerate their return on investment by enabling them to screen the quality of their die on the wafer and ensure that only die that meet their specifications are subsequently packaged. Chipmakers can also feed this test data back to their manufacturing operations to improve their fabrication processes several weeks sooner than if the test information was obtained after packaging. This ability to optimize two key manufacturing parameters-cost of test and yield-is a leading reason why IC manufacturers are increasingly turning to FormFactor's solutions. At the core of FormFactor's product portfolio is its patented MicroSpring(r) interconnect technology and proprietary design processes. The MicroSpring contactor's resilient, spring-like elements provide low contact force to permit testing without damaging semiconductors, particularly those incorporating fragile next-generation materials like low-k dielectrics. MicroSpring contacts are manufactured through precision micromachining and semiconductor-like wafer fabrication processes-making them highly scalable to shrinking semiconductor geometries. The contacts include geometrically precise tip structures, which enable reliable electrical contact over hundreds of thousands of touchdowns with minimal maintenance. By utilizing its extensive library of MicroSpring intellectual property, FormFactor can develop customized wafer probe cards to accommodate customers' unique product designs. Another key strength of FormFactor's products is their ability to enable high test parallelism. Reducing test costs requires the ability to increase the number of die tested (parallelism) during each touchdown on the wafer surface. This improves test cell throughput by reducing the number of touchdowns and the total time needed to test each wafer, which in turn means that fewer testers are needed to provide the required test capacity. FormFactor pioneered the concept of wafer-level parallelism with its TRE(r) technology, which significantly increases the number of ICs that can be tested on a wafer simultaneously. The result is lower total cost of test, helping IC manufacturers fully realize the financial benefits of 300-mm wafer manufacturing. History Founded in 1993, FormFactor established its headquarters, R&D and manufacturing operations in Livermore, Calif., in 1995. That same year, FormFactor introduced its first wafer probe card based on its MicroSpring technology. FormFactor completed its initial public offering of stock on June 11, 2003, and is traded on the Nasdaq National Market under the symbol FORM. Today, FormFactor has over 700 employees worldwide, with sales, service and design centers in North America, Europe, Japan, Korea and Taiwan. http://www.formfactor.com/ Regards Vivek ------------------------------------------------------------------ To unsubscribe from si-list: si-list-request@xxxxxxxxxxxxx with 'unsubscribe' in the Subject field or to administer your membership from a web page, go to: //www.freelists.org/webpage/si-list For help: si-list-request@xxxxxxxxxxxxx with 'help' in the Subject field List forum is accessible at: http://tech.groups.yahoo.com/group/si-list List archives are viewable at: //www.freelists.org/archives/si-list Old (prior to June 6, 2001) list archives are viewable at: http://www.qsl.net/wb6tpu