[SI-LIST] EFT Testing and Common Pitfalls, meeting notice.
- From: Mellberg Hans <htmguy@xxxxxxxxx>
- To: 'Si-List' <si-list@xxxxxxxxxxxxx>
- Date: Mon, 8 Oct 2001 08:19:16 -0700 (PDT)
The Santa Clara Valley Chapter of the IEEE EMC Society
presents:
EFT Testing and Common Pitfalls
By: Doug Smith
TUESDAY, October 9th at SGI in Mountain View, CA
Social begins at 5:30pm and presentation at 7:00pm
Please visit our website for full details including
map.
www.scvemc.org
Details:
Doug Smith, will cover the background of EFT testing
(IEC 61000-4-4) w along with common pitfalls. Doug
will also share some tips on the testing process. Doug
believes that all talks should have some entertainment
value and this talk is not an exception. War stories
and demonstrations will be used throughout the talk.
One of these covers a common mistake that some testing
labs make that can nearly double the stress on the
EUT. If you have an EFT Burst Generator what do you do
with it when it is not being used (probably most of
the time unless you work for a test lab)? Doug will
cover some test / debug techniques using an EFT
generator that have nothing to do with EFT, such as
solving ESD problems and measuring noise margins at
the PWB and circuit trace level.
Mr. Smith held an FCC First Class Radiotelephone
license by age 16 and General Class amateur radio
license at age 12. He received a B.E.E.E. degree
from Vanderbilt University in 1969 and an M.S.E.E.
degree from the California Institute of Technology in
1970. In 1970, he joined AT&T Bell Laboratories as a
Member of Technical Staff. He retired in 1996 as a
Distinguished Member of Technical Staff.
From February 1996 to April 2000 he was Manager of EMC
Development and Test at Auspex Systems in Santa Clara,
CA. Mr. Smith currently is an independent consultant
specializing in high frequency measurements,
circuit/system design and verification, switching
power supply noise and specifications, EMC, and
immunity to transient noise. He is a Senior Member of
the IEEE and a member of the IEEE EMC Society Board
of Directors.
His technical interests include high frequency effects
in electronic circuits, including topics such as
Electromagnetic Compatibility (EMC), Electrostatic
Discharge (ESD), Electrical Fast Transients (EFT), and
other forms of pulsed electromagnetic interference. He
also has been involved with FCC Part 68 testing and
design, telephone system analog and digital design, IC
design, and computer simulation of circuits. He has
been granted over 15 patents, several on measurement
apparatus.
Mr. Smith has lectured at Vanderbilt University, AT&T
Bell Labs, and at many public and private seminars on
high frequency measurements, circuit design, ESD, and
EMC.
He is author of the book High Frequency Measurements
and Noise in Electronic Circuits and is currently
working on his second book.
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