[SI-LIST] Re: Diif pair geometry trade offs

  • From: Vadim Heyfitch <htc2rl@xxxxxxxxx>
  • To: si-list <si-list@xxxxxxxxxxxxx>
  • Date: Fri, 15 Jun 2007 13:51:30 -0700 (PDT)

Actually there is solid evidence to the contrary: id does matter in packages 
how far away is the nearest return current via to the signal via. But maybe you 
bundled this under the broad stroke of "well engineered power delivery systems"?
-Vadim


Lee Ritchey <leeritchey@xxxxxxxxxxxxx> wrote: Joel,

Why are you worried about decreasing the trace width.  We do thousands of10
Gb/S diff pairs with 3.5 mil traces.  As to ground vias for layer changing,
if you have well engineered power delivery systems, the "return currents"
will have no trouble changing layers without the need for ground vias
nearby.

Lee Ritchey
Speeding Edge


> [Original Message]
> From: Joel Brown 
> To: Ken Cantrell ; SI-List

> Date: 6/14/2007 10:09:30 AM
> Subject: [SI-LIST] Re: Diif pair geometry trade offs
>
> I just wanted to clarify a few things in my original post:
>
> There have been several suggestions to decrease the trace width to
maintain
> the same impedance with decreasing dielectric height. My traces are
already
> down to 4.8 mils and I don't want to go much smaller, that is why I stated
> that I would have to increase the gap between traces in a pair to maintain
> impedance.
>
> The 3x spacing refers to separation from one pair to another or from one
> pair to a single ended trace, not the gap between the + and - signal
within
> a pair.
>
> I also have a new question: If a diff pair changes layers from the top
layer
> (microstrip) to layer 3 (stripline) should a ground via be placed near the
> transition via? When the signal is on the top layer it will be using
layer 2
> ground plane as the reference plane. When the signal is on inner layer 3
it
> will be using the ground plane on layers 2 and 4 as the reference plane. 
>
> I do have Hyperlynx which will solve for impedance values but it does not
> model return currents flowing through planes and vias. 
>
> Thanks - Joel
>
>
> -----Original Message-----
> From: Ken Cantrell [mailto:Ken.Cantrell@xxxxxxxxxxxxxxxx] 
> Sent: Thursday, June 14, 2007 9:12 AM
> To: joel@xxxxxxxxxx; SI-List
> Subject: RE: [SI-LIST] Diif pair geometry trade offs
>
> Joel -
> If you don't have a solver get one so that you can see the effects
yourself.
> I would also add that density is always an issue.  If not now, it will be
in
> the future.
> These are general, not specific, guidelines for operation <= 500MHz.
> Minimize the dielectric height.  The smaller the height the smaller the
> trace width can be, and the closer the diff pair line spacing can be.  "In
> order to do this I would have to increase the inter pair spacing to
maintain
> 100 ohms impedance".  Reduce your trace width to maintain the same
> single-ended impedance at the reduced dielectric height and see what you
> come up with.  You can also do trickier things to minimize the diff
spacing
> if you are only concerned about diff Z on that particular trace layer.
> Shrinking all dimensions is, in general, a good thing.  You can safely
run 3
> mil trace widths and not be concerned about IR losses as long as your
total
> path length is less than 36" or so.  Dielectric losses are not a concern
at
> this point.
> Noise coupling on the reference plane in this context is typically not an
> issue for EMI or SI.  You might want to increase the lane-to-lane spacing
to
> some multiple of the line-to-line diff pair spacing for crosstalk reasons
> depending on your driver type and board geometry.  I would be more
concerned
> about the number of vias/line and via lengths than reference plane
currents.
> The primary concern is length matching.  There was a recent thread
entitled
> "matching within 1 mil" that discussed some aspects of this issue that you
> might want to look at.  Length matching directly effects the diff to
common
> mode conversion that you are concerned about.  The rules for length
matching
> are ambiguous at best, and more research needs to be done in this area.  I
> use no more than 5 deg of phase at the frequency of operation.  100 mils
> matching (3 deg at 500MHz, er = 4.0)will work on Data/ADD/CMD/CTRL. 
Clocks
> might have to be run tighter depending on the application.  Interface
> requirements are given by the parts manufacturers in most cases.  Use them
> as guidelines.  I often use Tech Support if I have any questions.
>
> Ken
>
> -----Original Message-----
> From: si-list-bounce@xxxxxxxxxxxxx
> [mailto:si-list-bounce@xxxxxxxxxxxxx]On Behalf Of Joel Brown
> Sent: Wednesday, June 13, 2007 12:46 PM
> To: SI-List
> Subject: [SI-LIST] Diif pair geometry trade offs
>
>
> I am working with a layout that uses diff pairs routed as stripline on
> internal layers and micro strip on outer layers. These include PCI
Express,
> USB, LVDS, Ethernet.
> There are guidelines I have read that recommend spacing between pairs and
> between other signals should be at least 3x dielectric height for
stripline
> and 4x dielectric height for microstrip.
>
> I am using 13.5 mils dielectric height for the internal layers which
means I
> need spacing of 40 mils.
>
> If I want to increase my routing density (decrease spacing) then I would
> need to decrease the dielectric height.
>
> In order to do this I would have to increase the inter pair spacing to
> maintain 100 ohms impedance which would reduce the inter pair coupling and
> increase the coupling to the reference plane.
>
> This means more current would flow on the plane. My understanding is that
> this plane current flows in a circular loop on the plane underneath the
diff
> pair traces essentially cancelling itself out to some degree. My question
is
> there any issue (EMI or other) with forcing more of the return current to
> flow on the planes? If density was not an issue would it be desirable to
> make the dielectric height as large as possible to reduce reference plane
> current?
>
>
>
> Thanks - Joel
>
>
>
>
>
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