[SI-LIST] Re: Dielectric Constant - thin materials - DC to 10GHz
- From: "Mike Kauffman" <mkauffman@xxxxxxxxxxxx>
- To: <Farah.Haddadin@xxxxxxxxx>, <si-list@xxxxxxxxxxxxx>
- Date: Mon, 1 Dec 2003 08:57:12 -0800
I have not used these devices, but have seen them advertised for years
by a company called Damaskos (www.damaskosinc.com)
_______________________
Mike Kauffman
Infinera, Incorporated
-----Original Message-----
From: Haddadin, Farah [mailto:Farah.Haddadin@xxxxxxxxx]=20
Sent: Monday, December 01, 2003 8:51 AM
To: si-list@xxxxxxxxxxxxx
Subject: [SI-LIST] Re: Dielectric Constant - thin materials - DC to
10GHz
Hello everyone,
I am looking for a fixture that is capable of measuring permittivity of
thin materials from DC - 10GHz. There are two issues here:
1) The wide band of frequency: do I have to create two fixtures: one
for low frequency and one for high?
2) The thickness of the material to be tested: I was told that the
thickness of the material should roughly be: 20/sqrt(Er) [mm]. For
example, for a permittivity of 4, the thickness of the material under
test should be 10 mm. This is a conservative thickness estimator, but
the thickness of the materials of my interest is 0.1mm - 1mm.
I would greatly appreciate it if someone can point me to an existing
fixture or methodology to test such thin materials for the frequency
range mentioned above. Also, is there any reading material on the web
on how to create fixtures?
Thank you,
Farah
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