> > Thanks for your comments, Jian. > >However, I still don't know the answer - does the width of the pad versus the trace matter. I know the cap will cause discontinuity, as you mentioned below. Can we safely assume that the discontinuity from the pad is much less than the the cap. I can't find a simple simulation to do to verify. > >Thanks > > The answer to your question is : perhaps To find out if it does or doesn't in your particular case perhaps you could run two simulations: 1) One scenario would have a t-line and a set of capacitor pads the same width as your proposed capacitor in series with the t-line. Connect the pads together with a short section of t-line (same Z as the input/output t-lines). Terminate the output line. __ __ ============|__|=|__|============== 2) Scenario 2 would be the same as above EXCEPT, don't short the pads together, but put your proposed capacitor there. __ __ ============|__|-|(-|__|============== Run a freq. domain simulation on both of these and compare the results. If the results of the two simulations are substantially the same then the cap isn't contributing much more degradation than the cap mounting pads are. On the other hand, it the simulation with the cap in place is "worse" by your criteria, then you can probably conclude the cap is contributing more of a discontinuity that just the pads. -Ray ------------------------------------------------------------------ To unsubscribe from si-list: si-list-request@xxxxxxxxxxxxx with 'unsubscribe' in the Subject field or to administer your membership from a web page, go to: //www.freelists.org/webpage/si-list For help: si-list-request@xxxxxxxxxxxxx with 'help' in the Subject field List archives are viewable at: //www.freelists.org/archives/si-list or at our remote archives: http://groups.yahoo.com/group/si-list/messages Old (prior to June 6, 2001) list archives are viewable at: http://www.qsl.net/wb6tpu