[SI-LIST] Re: Article discussion on bad packages - core

  • From: Larry SMITH <Larry.Smith@xxxxxxx>
  • To: twesterh@xxxxxxxxx
  • Date: Tue, 04 Jan 2005 11:37:43 -0800

Todd - Your comments are right on target!  I've been sorting through all
my email after a nice long break and there has been a lot of energy on
this thread.  One of the confusion factors is that we are getting SSN
and I/O return current mixed up with core power transients (VDD/Gnd).
These are two very different PI topics and need to be considered in very
different  ways.  I want to make some further remarks to your comments
on the core PDS.  As you have implied, the correct approach is to
examine the individual components (chip, package, PCB) and combine them
into a power distribution system.

1) On-die decoupling capacitance is very important because it is the
only charge reservoir that is going to supply current above
approximately 100MHz to a system that has a target impedance of
approximately 1 mOhm.  1.59pH is 1 mOhm at 100MHz and it is nearly
impossible reduce the package inductance to that realm.  The chip must
be self sufficient above some frequency, approximately 100 MHz. Our
recent micro processors have had on-chip decoupling capacitance on the
order of 500nF, which is 3.18mOhms at 100 MHz, so we have chosen the
dividing line at about the right frequency.

The best way to find the on-chip capacitance is to measure it.  I have
not seen a software tool yet that can correctly predict the whole chip
capacitance.  Measure the capacitance of a bare PCB using a VNA and then
attach the chip and remeasure.  The capacitance of the chip is the
difference between the two measurements.  Be sure and bias the chip at
the proper voltage.  In my experience, the capacitance of the chip goes
up about 3X with bias because of all the FET channels are formed by gate
bias.  The chip comes up in a completely unknown state but I don't
believe the chip capacitance is a strong state function.  The gates that
are not switching form capacitance for those that are.

The on-chip capacitance forms a parallel LC circuit with the package
inductance and PCB impedance and makes a PDS peak that I call
chip/package resonance.  It is the most difficult impedance peak in the
PDS.  I have not seen a system yet that meets target impedance in this
frequency band, but they seem to keep working anyway, probably because
the circuits can tolerate more voltage drop than we thought.

2) On-package capacitance can help this situation, but the challenge is
to hook it up with conductors that are less than the target impedance.
Very Difficult!  One strategy is to take the core power solder bumps
straight down to the PCB pins with package vias.  In this case,
on-package capacitance must be off to the side.  It is very difficult to
mount capacitors on the package and channel their current into the core
power solder bumps with 1 mOhm or less of series impedance at 100 MHz.
Package power planes suffer from the same spreading inductance and
perforation degradation as PCB power planes.

Another strategy is to place the on-package capacitors directly
underneath the chip core and connect them with 100's of package vias.
This makes the on-package capacitors effective but now you have to bring
in ~100 amps of DC current on package power planes that are probably
perforated.  Hmmm.  There is really no good way to do it and this may be
the very motivation behind the EE Times article and the subject of this
thread.

The decisions made by the package designer pretty much determine the
quality of the PDS that the circuits on the chip see as they look for
gobs of current at low impedance.  It is certainly possible to make a
mistake on-chip or on-pcb, but the electronic package is probably the
most critical part of the core PDS design.  To a great extent, the pin
pitch of the package influences the spreading inductance of the
perforated PCB power planes that bring power to the core power pins.  If
the core power pins are surrounded by many rows of I/O pins on 1
millimeter pitch, there will be precious little copper left between the
PCB antipads to channel the current.  High resistance and high
inductance!  If there are 1000's of I/O, the PCB will have to be thick
to escape all the signals, which drives up the via and antipad size,
further compounding the problem.  This is just another example of
decisions made by the package designer affecting the PDS quality of the
system by forcing constraints on the PCB power planes.  The package
design can truly make or break the system design.

3) Your question (proposal) pertains to documenting a chip's high speed
power requirements.  Let's further clarify it to be a "packaged chip"
because a corner frequency has already been set by the chip/package
resonant frequency.  The PCB designer is responsible for keeping the PDS
impedance below the target up to the corner frequency that is
established by chip/package resonance.  The "breakout" portion of the
PCB should be considered to be part of the package because it's design
dimesions have been set by the package.  The impedance of the broad PCB
should be resistive rather than inductive at the chip/package resonant
frequency because that lowers the Q of the resonant circuit (inductance
raises the Q).

The most crucial piece of information from the chip manufacturer is the
maximum and minimum currents that can be drawn from the PCB PDS.  This
establishes the dI or transient current that the PCB must supply.  The
rise time (dt) is determined by the low pass filter associated with the
chip/package resonant frequency.  Generally, customer code will
determine the current waveform and therefor the frequency profile of the
current drawn by the chip, so I don't believe it is fair to ask chip
vendors for the power spectrum.  However, they should be obligated to
give their customers the maximum and minimum current that their chip
will ever draw.  The minium I is probably determined by sleep mode and
power saving states.

There is a move a foot to standardize the tools and methods used for
power integrity.  This is a very worthwhile endeavor.  But it is a huge
problem and must be broken down into solvable parts.  This note pertains
to core power and transient current on Vdd and Gnd.  The SSN and return
current PI problem is entirely different.  It will help if we divide
these two problems and conquer them individually.

regards,
Larry Smith
Sun Microsystems

Todd Westerhoff (twesterh) wrote:
> Happy New Year to all!
> 
> Having gone through the collection of messages to this point, I have a few
> questions I'd like to raise:
> 
> 1) How are people accounting for the effects of on-die decoupling in their
> analyses?  We can analyze the power delivery capbilities of the package, but
> part of the power delivery system is implemented by on-die decoupling, isn't
> it?  How do folks go about extracting die parasitics and incorporating them
> into their PDS analyses?
> 
> 2) It seems to me that the combination of on-die and [optionally] on-package
> decoupling makes the package/die PDS self-sufficient above some frequency.
> If we look at the board PDS, the target PDS impedance requirements would
> therefore increase with frequency.  The rolloff (or rollup, if you prefer)
> of target impedance with frequency would be design-specific, and, I believe,
> complex to determine, but would nonetheless serve as a design requirement
> for the board's PDS at that point.
> 
> My question here - does anyone else think this would be a possible and
> reasonable method for documenting a chip's high speed current requirements?
> I suggest we leave FPGAs out for the moment, since their requirements will
> be design specific.  Could we document PDS impedance/frequency profiles for
> standard components, and use that information to segregate some of the high
> speed signaling and PDS design tasks?
> 
> Comments are welcome and appreciated.
> 
> Todd.
> 
> Todd Westerhoff
> High Speed Design Specialist
> Cisco Systems
> 1414 Massachusetts Ave - Boxboro, MA - 01719
> email:twesterh@xxxxxxxxx
> ph: 978-936-2149
> ============================================
> 
> "Always do right.
>  This will gratify some people and astonish the rest."
> 
> - Mark Twain
> 
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