[ibis-macro] Dissecting Figure 16, and interpreting it for Legacy and ECL [Model]s for Devices Under Test (DUT) and Devices In Action (DIA)

From: Walter Katz <wkatz@xxxxxxxxxx>
To: <ibis-editorial@xxxxxxxxxxxxx>, "IBIS-ATM" <ibis-macro@xxxxxxxxxxxxx>, <ibis-interconn@xxxxxxxxxxxxx>
Date: Sat, 12 Mar 2016 13:20:26 -0500 (EST)

All,

Figure 16 in IBIS describes in a very general way a Device Under Test
(DUT). It does not do a very good job of distinguishing between rail
voltages under test vs rail terminals for a Device In Action (DIA). And
the section is very confusing on how to hook up C_comp for compensation
for DUT data and how to hook up C_comp when DIA (rail voltages floating
and not constant).

The most common case in IBIS is

[Pulldown Reference]==[GND Clamp Reverence]==0.0V

[POWER Clamp Reference]==[Pullup Reference]==[Voltage Range]

The second most common case in IBIS is ECL

[GND Clamp Reverence]=="Data Book VEE"

[POWER Clamp Reference]==[Pullup Reference]== [Pulldown Reference]="Data
Book VCC"

Focusing on these two most most common cases, what does this look like
when measuring the device (DUT) to generate the model and using the model
for a device in action. I built a "Virtual Test Bench" to represent the
measurement one would do on a real test and operating system. I put probes
at location where one can actually make measurement in real hardware
(although it is much easier to put SPICE probes in a virtual test bench
then to instrument the real hardware). It is also possible to put probes
in a virtual test bench that are impossible to instrument in hardware and
are in fact meaningless measurements (e.g. a differential probe between a
die terminal and the reference voltage of a VRM 3 feet away).

Please review these schematics. These would be interesting to discuss in
ATM, Interconnect, GND Editorial or the Open Forum.

Walter

Walter Katz

<mailto:wkatz@xxxxxxxxxx> wkatz@xxxxxxxxxx

Phone 303.449-2308

Mobile 303.335-6156

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[ibis-macro] Dissecting Figure 16, and interpreting it for Legacy and ECL [Model]s for Devices Under Test (DUT) and Devices In Action (DIA)

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