On Oct 12, 2014, at 11:03 PM, Graeme Gill <graeme@xxxxxxxxxxxxx> wrote: >> Is there any chance that input profiling could be expanded to support both >> spectral >> reflective measurements of the reference charts and .sp illuminant readings >> of the >> source used to photograph the chart? > > I'm not sure how that differs from the current code. As far as I recall, > spectral > references are currently supported - scanin will combine a "cie" reference > file > in .ti3 spectral format with the scanned values, and then colprof will let > you specify the illuminant. So if you want to create different profiles > for different illuminant from the same .ti3 file, you can. Hmm...I think I may have been a bit confused. Either you're correct that colprof -i does what I think I want to accomplish and I was assuming it wouldn't, or I need to better understand what it is that I think that I want to accomplish. I'll do some experimentation and let you know. Thanks, b&
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