[SI-LIST] Re: modeling for tantalum capacitors and aluminium electrolytic capacitors
- From: <TeddyChou@xxxxxxxxxx>
- To: <si-list@xxxxxxxxxxxxx>
- Date: Thu, 6 Jan 2005 17:42:08 +0800
Hi Ray and John,
Thanks for your great help. These papers are very useful for me. So does John's
PDS book.
TeddyChou
-----Original Message-----
From: Ray Anderson [mailto:ray.anderson@xxxxxxxxxx]
Sent: Wednesday, January 05, 2005 12:31 AM
To: si-list@xxxxxxxxxxxxx
Cc: Teddy Chou
Subject: Re: [SI-LIST] modeling for tantalum capacitors and aluminium
electrolytic capacitors
TeddyChou@xxxxxxxxxx wrote:
>I just learned about power distribution system design. So far, I have had some
>experiences in ceramic cap modeling by VNA measurement. But I couldn't find
>any materials or papers to talk about how to measure tantalum capacitors and
>aluminium electrolytic capacitors. Does any SI expert know it? Thanks in
>advance.
>
>Teddy Chou
>
>
John Barnes just posted a most excellent bibliography of numerous papers
and other resources related to PDN design. I'd recommend looking into
any number of those listed publications.
To answer your question more specifically, I'd recommend you visit
Istvan Novak's web site and obtain copies of several of the papers he
and some of his colleagues have written on the topic of decoupling
capacitor measurement techniques over the past several years.
Specifically, check out the following three papers:
"Measuring MilliOhms and PicoHenrys in Power Distribution Networks"
http://home.att.net/~istvan.novak/papers/dc2000_rev.pdf
http://home.att.net/~istvan.novak/papers/dc2000_slides.pdf
"Frequency-domain Power Distribution Measurements - An Overview"
http://home.att.net/~inovak/papers/DC03-East_HP-TF1_SUN.PDF
"Frequency Dependent Characterization of bulk and Ceramic Bypass Capacitors"
http://home.att.net/~istvan.novak/papers/EPEP2003_cap_models.PDF
http://home.att.net/~istvan.novak/papers/EPEP2003_cap_models_poster.PDF
One of the key concepts that you'll take away from these articles is the
problem of errors induced by cable-braid ground loops and the need for
isolation transformers or isolation amplifiers when making low frequency
ESR measurements on bulk capacitors. The isolation techniques he
presents can reduce the errors induced by the ground loop effect that
can mask the actual low value impedances you are trying to measure.
Ray Anderson
Senior Signal Integrity Staff Engineer
Xilinx Inc.
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