[SI-LIST] Re: common-mode current limit on hard disks
- From: John Barnes <jrbarnes@xxxxxxxxx>
- To: si-list@xxxxxxxxxxxxx
- Date: Thu, 28 Feb 2002 08:26:43 -0500
Jan,
Al Wallash has written a number of papers about electrostatic discharge
(ESD), even up to 15-20 feet away, damaging or destroying the read/write
heads for hard disks. Many of these papers can be downloaded from his
website http://www.wallash.com/
Some references, from my webpage
http://www.r-e-d-inc.com/esd-anno.htm
are:
[689] Himle, Jenny Ariane, "Electrostatic Discharge Considerations for
GMR Heads." (download from http://www.wallash.com/jenny.htm)
[690] Himle, Jenny, "Off-track Testing to Evaluate ESD Damage to MR
Heads," IEEE Transactions on Magnetics, vol. 32 no. 5, pp.
3455-3457, Sept. 1996.
[896] Levit, Larry, and Wallash, Al, "Measurement of the effects of
ionizer imbalance and proximity to ground in MR head handling,"
Journal of Electrostatics, vol. 47 pp. 305-313, 1999. (download
from http://www.ion.com/storage/shared/Elsevier.pdf)
[1385] Wallash, Al, and Wang, Wenwei, "A Study of Diode Protection for
Giant Magnetoresistive Recording Heads," Electrical
Overstress/Electrostatic Discharge Symposium Proceedings, Orlando,
FL, Sept. 28-30, 1999, pp. 385-390. (download from
http://www.wallash.com/diode_gmr.pdf)
[1386] Wallash, A., and Wang, Wenwei, "A study of diode protection for
giant magnetoresistive recording heads," Journal of
Electrostatics, vol. 49 no. 3-4, pp. 257-267, Aug. 2000.
[1387] Wallash, Albert J. and Hughbanks, Timothy H., "Capacitive
Coupling Effects in Spark Gap Devices," Electrical
Overstress/Electrostatic Discharge Symposium Proceedings, Las
Vegas, NV, Sept. 27-29, 1994, pp. 273-278.
[1388] Wallash, Al, and Smith, Doug, "Damage to Magnetic Recording Heads
due to Electromagnetic Interference," 1998 IEEE EMC Symposium
Record Volume 2, Denver, CO, Aug. 24-28, 1998, pp. 834-836.
[1389] Wallash, Al, and Smith, Doug, "Electromagnetic Interference (EMI)
Damage to Giant Magnetoresistive (GMR) Recording Heads,"
Electrical Overstress/Electrostatic Discharge Symposium
Proceedings, Reno, NV, Oct. 6-8, 1998, pp. 368-374.
[1390] Wallash, Al, and Smith, Doug, "Electromagnetic Interference (EMI)
Damage to Giant Magnetoresistive (GMR) Recording Heads."
(download from http://www.wallash.com/emidamage.pdf)
[1391] Wallash, Al, "Electrostatic Discharge (ESD) in Magnetic
Recording: Past, Present and Future." (download from
http://www.wallash.com/esdpast.pdf)
[1392] Wallash, Albert J., and Kim, Young K., "Electrostatic discharge
sensitivity of giant magnetoresistive recording heads," Journal of
Applied Physics, vol. 81 no. 8 part 2, pp. 4921-4923, Apr. 15,
1997.
[1393] Wallash, Albert J., "Electrostatic Modeling and ESD Damage of
Magnetoresistive Sensors," IEEE Transactions on Magnetics, vol.
32 no.1, pp. 49-53, Jan. 1996.
[1394] Wallash, Al, "ESD Demonstrations." (download from
http://www.wallash.com/SiVa%20ESD%20Demo.pdf)
[1395] Wallash, Albert, Hillman, James, and Wang, Dexin, "ESD Evaluation
of Tunneling Magnetoresistive (TMR) Devces," Electrical
Overstress/Electrostatic Discharge Symposium Proceedings, Anaheim,
CA, Sept. 26-28, 2000, pp. 470-474.
[1396] Wallash, Albert J., Hughbanks, Timothy S., and Voldman, Steven
H., "ESD Failure Mechanisms of Inductive and Magnetoresistive
Recording Heads," Electrical Overstress/Electrostatic Discharge
Symposium Proceedings, Phoenix, AZ, Sept. 12-14, 1995, pp.
322-330.
[1397] Wallash, Albert J., Hughbanks, Timothy S., and Voldman, Steven
H., "ESD failure mechanisms of inductive and magnetoresistive
recording heads," Journal of Electrostatics, vol. 38, pp. 159-173,
1996.
[1398] Wallash, Al, "ESD Testing of AMR and GMR Heads: A Comparison of
Magnetic Failure Thresholds," Apr. 22, 1998. (download from
http://www.wallash.com/esdtestingidema.pdf)
[1399] Wallash, Albert, "ESD Testing of Head Stack Assemblies Used in
Magnet Recording Hard Disk Drives," Electrical
Overstress/Electrostatic Discharge Symposium Proceedings, Orlando,
FL, Sept. 28-30, 1999, pp. 297-301.
[1400] Wallash, Al, "ESD Testing of Head Stack Assemblies with GMR
Heads." (download from http://www.wallash.com/hsa_esdtesting.pdf)
[1401] Wallash, Albert, and Honda, Masamitsu, "Field-induced Breakdown
ESD Damage of Magnetoresistive Recording Heads," Electrical
Overstress/Electrostatic Discharge Symposium Proceedings, Santa
Clara, CA, Sept. 1997, pp. 382-385.
[1402] Wallash, Albert, and Honda, Masamitsu, "Field-induced Breakdown
ESD Damage of Magnetoresistive Recording Heads." Journal of
Electrostatics, vol. 44 no. 3-4, pp. 257-265, Sept. 1998.
(download from http://www.wallash.com/fib.pdf)
[1403] Wallash, Albert J., Field-Induced Charged Device Model Testing of
Magnetoresistive Recording Heads", Electrical
Overstress/Electrostatic Discharge Symposium Proceedings, Orlando,
FL, Sept. 10-12, 1996, pp. 8-13.
[1404] Wallash, A., and Kim, Young K., "Magnetic Changes in GMR Heads
Caused by Electrostatic Discharge," IEEE Transactions on
Magnetics, vol. 34 no. 4, pp. 1519-1521, July 1998.
[1405] Wallash, Albert J., and Kim, Young K., "Magnetic Changes in GMR
Heads During Electrostatic Discharge Events," The 7th Joint
MMM-INTERMAG Conference, San Francisco, CA, Jan. 6-9, 1998, pp.
247.
[1406] Wallash, Albert J., "Standardized ESD Test for Magnetoresistive
Recording Heads," IEEE Transactions on Magnetics, vol. 33 no. 5,
pp. 2911-2913, Sept. 1997.
[1407] Wallash, Al, "Understanding ESD Damage to Magnetoresistive (MR)
Recording Heads." (download from
http://www.wallash.com/understa.htm)
[1408] Wallash, Al, "Understanding ESD in Magnetic Recording or ESD
Control for Very Sensitive Devices," Electrostatic Discharge
Association National Tutorials, Tutorial D, Anaheim, CA, Sept. 24,
2000.
[1409] Wallash, Albert, "Zap! Another MR head bites the dust," DATA
Storage, Jan. 1998. (download from
http://ds.pennnet.com/Articles/
Article_Display.cfm?Section=Archives&Subsection=Display&
ARTICLE_ID=37855&KEYWORD=Wallash)
Enjoy!
John Barnes
dBi Corporation
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