[SI-LIST] Waveform Correlation
- From: "Abe Riazi" <ARIAZI@xxxxxxxxxxx>
- To: <si-list@xxxxxxxxxxxxx>
- Date: Sat, 25 May 2002 09:32:48 -0700
Dear all,
Comparing simulation generated waveforms with the corresponding lab measured
data can yield valuable information towards identifying/eliminating signal
integrity problems, enhancing buffer and
interconnect models, and optimizing simulation/measurement techniques, etc.
One effective correlation approach involves superimposing the measured and
simulated
waveforms utilizing Microsoft Excel. This is feasible because many simulator
and measurement
tools can output data in a format compatible with Excel. For instance, the
Multi-column (.dat) files exported by XNS and .csv (Comma Space Delimited)
files stored by digital oscilloscopes can be readily imported into an Excel
spreadsheet. It is important for the simulated and measured data
to have similar bit patterns and to be captured at the same location (topology
node). Let us
consider a sample case.
Example.
A signal waveform, belonging to memory subsystem of a high-speed motherboard,
was captured (in Read cycle) using a HP infinium 1.5GHz 8GSa/S oscilloscope,
in conjunction with Tektronix P6248 (1.7 GHz) differential probes. The result
was recorded in .bmp ( for quick viewing) and .csv ( for importing to Excel)
formats. Waveform examination revealed that the measured signal initiates
in High Z state, makes a transition to Low (remains Low for 5 nS), then
switches to High (stays
High for 10 nS), followed by another transitions to Low (for 5 nS) and finally
to High Z.
The corresponding simulations were performed utilizing XTK. A .mdc (
Multi-Driver
Contention) file was constructed in a manner that the driver output exhibited
same bit pattern as measured signal. Furthermore, the simulation waveform was
probed at the topology node
consistent with measured data. The simulation result was then exported and
saved in Multi-column (.dat) format. The measured " .csv " and the simulated
" .dat " files were entered into Excel for correlation analyses. It was noted
that the time axis of simulated result required a conversion (from nano seconds
to seconds) and the measured data needed a time shift of ~ 800pS, in order to
optimally overlay the two signals..
Above example has described a way for superimposing measured and simulated
waveforms.
With the simulated/measured results properly overlaid, it is possible to
evaluate their sameness
and/or differences. The signal features frequently examined include the low and
high DC quiescent voltage levels, the rise/fall times, overshoot/undershoot,
ringing, ringback, glitches, etc.
It is also important that the selected simulation corner (i.e. Min, Typ, Max)
and
the voltage/temperature conditions of measured data to be consistent with each
other.
Although, the nominal corner correlations are very common; correlating under
Fast (best case)
and Slow (worst case) requirements can be also beneficial. Furthermore, it may
be necessary to evaluate the signal waveforms at both the driver output and the
receiver input pins (or pads).
Comparison of simulated and measured data usually reveals certain differences
some
of which can be due to model deficiencies, simulator limitations, or certain
measurement
inaccuracies. Correctly interpreting the measured/simulated signal features,
their similarities
and differences constitute a crucial element of accurate correlation.
In summary, comparing key features of simulated and measured waveforms can be
helpful
towards identification/ removal of SI degradation, model optimization, and
improvements of simulation/measurement methods. Correlation can be carried out
by overlaying the measured
and simulated waveforms using the Excel program. This approach often
necessitates applying
certain adjustments/shifts to time axis data of one or both waveforms to
achieve optimum
superposition of the results. It is usually desirable that the points
(topology nodes) of capture,
driver output bit patterns, voltage/temperature conditions of simulated and
measured waveforms be nearly matched.
Your comments are highly appreciated.
Respectfully,
Abe Riazi
ServerWorks
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