[SI-LIST] Test point modeling in Sigexplorer
- From: "Landrum, Chris" <chris_landrum@xxxxxxxxxx>
- To: si-list@xxxxxxxxxxxxx
- Date: Thu, 6 May 2004 11:54:50 -0600
Hi all...
How would one model a test point that is connected to a tx-line using the
Cadence SigExplorer or SI-Expert tools? The test point would be say a
0.85mm circular pad that is connected in a short stub configuration off of a
50 ohm tx-line. Should the test point be modeled as a simple capacitor? Or
perhaps it is simply a stub. The purpose of the model would be to examine
the effects of the test point on signal quality.
Thanks.
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