[SI-LIST] Re: S-parameter passivity... Interpreting the results.

Celine,

If you are measuring things at or near 50 ohms and the test fixture and
the thing being measured will not resonate, think about the wavelength
of the highest frequency you want to evaluate and keep the length of the
test fixture to 1/20 or less. If you want to make a better measurement,
use 1/100. For example if you are working to 1GHz (Wavelength of 300mm)
anything around 3 mm should be measured and removed from the
measurement.

If you are measuring things that can resonate in the frequency band of
interest, then it gets tricky. You have to figure out what parasitic
impedances can get in the way of the measurement. For example, if you
are measuring the capacitance of an inter layer plane (Power plane to
Ground plane capacitance) that is 10 nF and you have a via to that plane
that is 75 microns long. You need to remove the via from the
measurement. This is assuming you want to evaluate the capacitance of
the VDD to Ground Plane and not what a chip will see at the surface.

If you are trying to measure the capacitance of the inner layer, you
need to conceder where the test setup will resonate. The inductance of a
75 micron via (3 Mils) is near (0.075 mm * 600 pH per mm) 45 pH. This
structure will resonate at 1/(2 PI Square Root (LC)). That is 1/(2 PI
Square Root (45 pH * 10 nF) or 237 MHz.=20

If you want to evaluate what a chip will see at the surface of the board
with a single via, you don't remove the via because that is what you
want to evaluate. What you do is port extend to the surface of the
board. Use a shorted connector of the same type as on the board to find
the electrical length of the distance from the calibration plane to the
surface of the board.

Best regards,

John

-----Original Message-----
From: si-list-bounce@xxxxxxxxxxxxx [mailto:si-list-bounce@xxxxxxxxxxxxx]
On Behalf Of Xilei Liu
Sent: Monday, June 26, 2006 6:34 AM
To: dgun@xxxxxxxxxx; travissellis@xxxxxxxxx; si-list@xxxxxxxxxxxxx
Subject: [SI-LIST] Re: S-parameter passivity... Interpreting the
results.

Will it help if all the adapters lengths are considered in the
calibration=20
procedure such that the calibrtion plane is brought to the DUT, for=20
instance, calibrate the cable together with an identical SMA connector
and=20
coaxial probe?

Celine


>From: dgun@xxxxxxxxxx
>Reply-To: dgun@xxxxxxxxxx
>To: si-list@xxxxxxxxxxxxx
>Subject: [SI-LIST] Re: S-parameter passivity... Interpreting the
results.
>Date: Sat, 24 Jun 2006 17:10:51 -0800
>
>My understanding is that you are calibrating to the 3.5mm connector
using=20
>t=3D
>he
>85052D cal kit, then trying to measure something at the end of an
adapter=20
>a=3D
>nd
>length of cable. If this is the case, then I'm not surprised you see
some
>ripple (or "noise"). The ripple is likely due to the adapter and length
of
>cable. You would need to deembed this using a model of the probe or
some=20
>so=3D
>rt
>of deembedding algorithm using reflects at the end of the probe.
>
>At a minimum, the electrical delay from the calibration plane to the
end of
>the probe should be calculated or measured and removed from the=20
>measurement.
>
>--
>Daniel
>
> > ----- Original Message -----
> > From: "travis ellis" <travissellis@xxxxxxxxx>
> > To: "Hill, John" <jhill@xxxxxxxxxx>, si-list@xxxxxxxxxxxxx
> > Subject: [SI-LIST] Re: S-parameter passivity... Interpreting the=20
>results.
> > Date: Tue, 13 Jun 2006 09:19:29 -0700 (PDT)
> >=3D20
> >=3D20
> > I'm using the 8052D broadband economy calibration kit. I've
performed a =20
>=3D
>full 2port SOLT=3D20
> > calibration calibrating out the cabling. All of which  use 3.5mm=20
>connecto=3D
>rs. Then I attach port=3D20
> > 2 to a 3.5mm - GPPO connector  that attaches to a 0.085 gppo
terminated=20
>c=3D
>able on one end. The=3D20
> > other  end of the cable (DUT) has a coaxial probe. Port 1 is
attached to=20
>=3D
>an  sma to gpo=3D20
> > connector that is mounted in a brass block and ground  smooth. This=20
>provi=3D
>des a coaxial structure=3D20
> > that I make contact to with  the coaxial probe that is on the other
end=20
>o=3D
>f the dut.
> >=3D20
> >    Travis
> > "Hill, John" <jhill@xxxxxxxxxx> wrote:  Travis,
> >=3D20
> > Which Calibration kit are you using and can you describe what is
between
> > the calibration plane and the thing you are trying to model? BTW,
what
> > RF connector are you using?
> >=3D20
> > Best regards,
> >=3D20
> > John
> >=3D20
> >=3D20
> >=3D20
> >=3D20
> > ---------------------------------------
> > The  information in this email and attachments hereto may contain=20
>legally=3D
>   privileged,=3D20
> > proprietary or confidential information that is intended  for a=20
>particula=3D
>r recipient. If you are=3D20
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for=20
>=3D
>delivery of this=3D20
> > message to  the intended recipient(s), you are hereby notified that
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>d=3D
>isclosure,  copying,=3D20
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>informatio=3D
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>ion contained in this=3D20
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>oy any paper copies.
> > ---------------------------------------
> > -----Original Message-----
> >=3D20
> > From: si-list-bounce@xxxxxxxxxxxxx
[mailto:si-list-bounce@xxxxxxxxxxxxx]
> > On Behalf Of travis ellis
> > Sent: Tuesday, June 13, 2006 11:00 AM
> > To: si-list@xxxxxxxxxxxxx
> > Subject: [SI-LIST] S-parameter passivity... Interpreting the
results.
> >=3D20
> > I've been taking measurements with a VNA then running them through a
> > passivity checker. The basis for the code was originally posted by
Ray.
> > I've modified it to meet my needs. Added plotting capabilities, log
mag
> > format handling, and nudging of the non-passive values when only a
few
> > points are out of spec etc. I don't think I broke anything in the
> > process but what I've noticed is that the eigen values of some of my
> > measurements are very noisy. The better measurements oscillate too
but
> > they trend upward with increasing frequency. The suspect
measurements
> > oscillate between near 0 and approximately 0.4 from point to point
> > across the higher frequency bands. The magnitude of the s-parameters
> > seem to be noisy as well. I've gone through my setup to make sure
that
> > my cables don't have loose/bad connections. Replaced some connectors
> > that seemed inadequate and while things got marginally better the
> > measurements still contained noise. The noise source seems to be my
> >   fixturing. Unfortunately I don't think I can improve this given my

>time
> > constraints.
> >=3D20
> >      The only thing that I've noticed is that the time domain=20
>simulations
> > take longer than those created with a data set that isn't as noisy.
> >=3D20
> >=3D20
> >      Is there a way to decide if these models are accurate enough to
be
> > reliable?
> >=3D20
> >      Regards,
> >=3D20
> >      Travis
>
>
>--=3D20
>___________________________________________________
>Play 100s of games for FREE! http://games.mail.com/
>
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