> 2) What are some of the things that can go wrong if the shoots are too = > large? > 2a) Is turning on the protection diodes the only concern? > > >gate oxide breakdown and electromigration, see above. There may be others. One that I've heard about, is "hot carrier" effect. I think it's another long-term reliability problem (like electromigration), where no functional damage might occur if you exceed the limit, but the part's lifetime is degraded. This makes it a matter of statistics and probabilities, and one where the theory and the empirical evidence may not be entirely in step. Andy ------------------------------------------------------------------ To unsubscribe from si-list: si-list-request@xxxxxxxxxxxxx with 'unsubscribe' in the Subject field or to administer your membership from a web page, go to: //www.freelists.org/webpage/si-list For help: si-list-request@xxxxxxxxxxxxx with 'help' in the Subject field List FAQ wiki page is located at: http://si-list.org/wiki/wiki.pl?Si-List_FAQ List technical documents are available at: http://www.si-list.org List archives are viewable at: //www.freelists.org/archives/si-list or at our remote archives: http://groups.yahoo.com/group/si-list/messages Old (prior to June 6, 2001) list archives are viewable at: http://www.qsl.net/wb6tpu