[SI-LIST] S11 and S21 for PCB trace with different dielectic think
- From: "John Kwan" <jkwan@xxxxxxxxxxx>
- To: <si-list@xxxxxxxxxxxxx>
- Date: Wed, 14 Jan 2009 21:14:52 -0800
Hi,
I am trying to extract the S11 and S21of some PCB traces using one of
the field solver tools. The traces are running on top of a solid ground
plane, and I run the simulation for two different dielectric thickness
settings. In one case, the Zo for the trace is around 50-ohm, and the
other case the Zo is around 80-ohm. The S11 and S21 for the two case is
quite different. The insertion loss S21 is much less and smoother
through out the frequency range in the case of 50-ohm. The reflection
coefficient S11 is also much closer to zero in the case of 50-ohm.
Is it because the port reference is set to 50-ohm for the simulation, so
the result for the 50-ohm case is much better? If so, how can we use the
result if the system is not 50-ohm in the real case?
Regards,
John
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