[SI-LIST] Re: Query on power noise sensitivity measurement problem
- From: <robert_sleigh@xxxxxxxxxxx>
- To: <si-list@xxxxxxxxxxxxx>
- Date: Mon, 28 Apr 2008 09:49:54 -0600
Greetings,
I received notice from several folks indicating that there was a problem =
with the link that I sent out. For some reason a few extra characters =
(specifically "=3D20") were appended to the link. I'm not sure why this =
happened, but the correct link ends in 206801021.
http://www.techonline.com/learning/webinar/206801021
Best regards,
Rob
-----Original Message-----
From: si-list-bounce@xxxxxxxxxxxxx [mailto:si-list-bounce@xxxxxxxxxxxxx] =
On Behalf Of SLEIGH,ROBERT (A-Sonoma,ex1)
Sent: Sunday, April 27, 2008 9:43 PM
To: huangchunxing@xxxxxxxxxx
Cc: si-list@xxxxxxxxxxxxx
Subject: [SI-LIST] Re: Query on power noise sensitivity measurement =
problem
Greetings,
Here's a link to a recent seminar which covers TX/RX PLL =3D =
characterization. =
http://www.techonline.com/learning/webinar/206801021=3D20
This measurement technique would also allow measurement of the Jitter =
=3D Spectrum (RJ/PJ RJ/SJ) while injecting "power noise on PLL =
power".=3D20
Best regards,
Rob Sleigh
Digital Test Division
Agilent Technologies, Inc.
-----Original Message-----
From: si-list-bounce@xxxxxxxxxxxxx [mailto:si-list-bounce@xxxxxxxxxxxxx] =
=3D On Behalf Of Huang chunxing
Sent: Saturday, April 26, 2008 2:02 AM
To: si-list@xxxxxxxxxxxxx
Subject: [SI-LIST] Query on power noise sensitivity measurement problem
Content-type: text/plain; charset=3D3Dgb2312
Content-transfer-encoding: 7BIT
Hi experts,
I am trying to find out whether it is possible to get the relationship =
=3D between powernoise and output jitter by measurement.
To be convenient, I would like to call it Power Noise sensivity. =3D20
My initial thought is to inject a certain frequency power noise on PLL =
=3D power, and then measure SJ at the frequency on TX output =
signal.=3D20 But it is some difficult to be applied in practice due to =
PDN impedance =3D variance.
Is there any craft method to avoid it?
As to RX side, it is difficult to loop out clock recovered by CDR.
I was ever been told that as TX and RX share same PLL, or use same =3D =
design PLL, so power sensitivity at RX is similar with power sensitivity =
=3D at TX. If we measure power sensitivity at TX, then we can get one at =
RX.
Is that true, or could stand at most cases?
I tried to find some documents for reference, but I failed.
I hope experts here who ever did similar work may give me some comments =
=3D and suggestions.
Thanks in advance! =3D20
Regards,
Huang Chunxing
HUAWEI TECHNOLOGIES CO.,LTD. =3D20
Address: Huawei Industrial Base
Bantian Longgang
Shenzhen 518129, P.R.China
Tel: +86 755 89651027
Fax: +86 755 89650600
E-mail: huangchunxing@xxxxxxxxxx
www.huawei.com
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- References:
- [SI-LIST] Re: 6 layers stackup
- From: Raju, Ramakrishna
- [SI-LIST] Query on power noise sensitivity measurement problem
- From: Huang chunxing
- [SI-LIST] Re: Query on power noise sensitivity measurement problem
- From: robert_sleigh
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