[SI-LIST] Query on power noise sensitivity measurement problem
- From: Huang chunxing <huangchunxing@xxxxxxxxxx>
- To: si-list@xxxxxxxxxxxxx
- Date: Sat, 26 Apr 2008 17:02:28 +0800
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Hi experts,
I am trying to find out whether it is possible to get the
relationship between powernoise and output jitter by measurement.
To be convenient, I would like to call it Power Noise sensivity.
My initial thought is to inject a certain frequency power noise
on PLL power, and then measure SJ at the frequency on TX output signal.
But it is some difficult to be applied in practice due to PDN impedance
variance.
Is there any craft method to avoid it?
As to RX side, it is difficult to loop out clock recovered by CDR.
I was ever been told that as TX and RX share same PLL, or use
same design PLL, so power sensitivity at RX is similar with
power sensitivity at TX. If we measure power sensitivity at TX,
then we can get one at RX.
Is that true, or could stand at most cases?
I tried to find some documents for reference, but I failed.
I hope experts here who ever did similar work may give me
some comments and suggestions.
Thanks in advance!
Regards,
Huang Chunxing
HUAWEI TECHNOLOGIES CO.,LTD.
Address: Huawei Industrial Base
Bantian Longgang
Shenzhen 518129, P.R.China
Tel: +86 755 89651027
Fax: +86 755 89650600
E-mail: huangchunxing@xxxxxxxxxx
www.huawei.com
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