[SI-LIST] Re: Pros/Cons of Agilent vs Tek scope for DDR2/DDR3 characterization

My problem with Agilent scope is that it doesn't support a crossover 
measurement of the dif signal as a standalone application, only as a part of 
the compliance test. Another usefull feature Agilent missing is gating the 
measurements by cursors. For instance, I'm looking at DQS Read immediately 
followed by DQS Write and want to make a crossover measurements only on DQS 
Write (or just first DQS Write transition) - the situation where On-die 
termination turns-off on the controller and turns-on on the memory. I've been 
told the work-around on Agilent is to zoom into the area of concern. But it 
won't work with Infiniscan triggers

From: praveen kumar [mailto:ypk705@xxxxxxxxx]
Sent: Thursday, April 16, 2009 11:39 PM
To: Eugene Ivanov
Cc: si-list@xxxxxxxxxxxxx
Subject: Re: [SI-LIST] Pros/Cons of Agilent vs Tek scope for DDR2/DDR3 
characterization

Eugene
From the probing easiness for DDR, agilent makes life easier but the tek has 
come out with a DDR analysis s/w and trimode probes which are worth trying. 
Check it out..
Regards
YPK
On Fri, Apr 17, 2009 at 9:37 AM, Eugene Ivanov 
<eugene.ivanov@xxxxxxx<mailto:eugene.ivanov@xxxxxxx>> wrote:
Need to make a selection of which scope to buy for DDR2/3 i/f JEDEC compliance 
testing on the memory controller(s). I personally like Tek scope but it is more 
expensive and its DDR  compliance test software doesn't support all the 
required parameters.
Did anybody evaluate both scopes for this application and which one you picked? 
What were pros/cons to go with Tek vs Agilent or vice versa?

Thanks in advance

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