[SI-LIST] IC power/ground and I/O noise measurements

The following message got lost in the manual 'to be approved' box.
Since the time to automatically forward it has expired I am manually 
sending it on to the list.

Please direct any comments to Ross, not me.


-Ray

 

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Date: Wed, 05 Jan 2005 16:38:11 -0000
From: "ross_carlton" <ross.carlton@xxxxxxxxxxxxx>
To: si-list@xxxxxxxxxxxxx
Subject: IC power/ground and I/O noise measurements
 
For those interested, IEC TC47/SC47A has recently published IEC 
61967-4. This measurement standard describes methodologies for 
measuring conducted emissions from integrated circuits in the 
frequency range of 150kHz to 1GHz. Networks are specified for 
measuring total/core noise as well as I/O noise. 

Additional application guidance is contained in IEC 62127. Details 
are provided for PCB design, measurement implementation, and IC 
activity. This document will be published in early 2005.

As the USNC expert on the working group, I would be interested in 
any comments or observations that you may have. Draft documents are 
available directly from me. Published documents may be purchased 
from the IEC at www.iec.ch.

Best regards,

Ross Carlton
Freescale Semiconductor
(512) 895-7994
ross.carlton@xxxxxxxxxxxxx

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