[SI-LIST] Re: Differential S-parameters

  • From: mmunroe <mmunroe@xxxxxxxxxxxxxx>
  • To: "INTERNET:databits@xxxxxxxxxxxxx" <databits@xxxxxxxxxxxxx>
  • Date: Fri, 11 Jan 2002 01:09:24 -0500

Gus,

You might be interested in attending Dr. Merkelo's TechForum (sponsored b=
y
Agilent and ERNI) on Monday January 28th 9:00-12:00 as part of DesignCon.=


His Oculus-Cascade s-parameter acquisition method generates S21 and eye
patterns
using TDT methods and a mainframe differential TDR.  Conversion between
2 and 4 port measurments, filtering, stubs and all sort of bit patterns a=
re
all part of the
work bench.  He will be talking about the characterization of differentia=
l
components including
traces, stubs, connectors, etc...  You can look at his paper from last
year's DesignCon.

I will be glad to buy the first round of beer in the lobby bar following
the afternoon Tech Forum
on Monday.   I will bring Oculus on my laptop if you want to look at some=

collected files. Let me
know and I will be glad to send you some recent presentation pages.

michael munroe
The ERNI Group


Message text written by INTERNET:databits@xxxxxxxxxxxxx
>Getting a bunch of single-ended s-parameter that have been to differenti=
al
s-parameters is a neat mathematical system that allows _close_ correlatio=
n
to _simulators_ (like ADS, Serenade, others?) when the "ports" component =
is
used.

In the simplest (most common) common simulation configurations, and using=
 4
ports, both of these systems use a perfect ground (i.e. node 0 reference)=

on
both sides (i.e. at each port) of the  device being measured.  "Accurate"=

can be a word used to  describe this comparison.

I can not say that "accurate" is incorrect.  Measuring what is being
modeled
and vice versa is a good thing....  however, for the measurements or the
model have anything to do with system performance, the currents should
return through the same path as is in the real system.


I have been trying to understand a better way of creating a differential
s-parameter measurement/simulation that is more indicative of SYSTEM
performance.  What I am struggling with is the same things as stated by
Mick, Patrick and Chuck.


Random Thought from the empirical perspective....
I like the baluns concept.... but these usually only have a very limited
bandwidth.  A different way (notice I did not say better) to approach the=

problem may be to only measure differential  "s11".  Basically, connect
port1 from 2 VNAs to two terminals on one side of the DUT (shifting the
phase of one of the VNAs 180, I wonder what the best way is to do that?).=

Then terminating the far end TO THE RETURN PATH through the device (yes, =
we
will have to have a "known termination")... look at the return loss for
each
port....  then some math to get the results,  The test may then need to g=
et
repeated with the DUT flipped ( s22'ish )...  and on and on and on and
on....  Yuck...  I will break the equipment budget with this one.  :)

 |-------|
 |     P1|---------|
 |VNA1   |         |
 |     P2|         |
 |-------|         |        |-----|
                   | -----> |     | ---/
                            | DUT |    \  Far End
 |-------|         | -----> |     | ---/
 |     P1|---------| (inv)  |-----|
 |VNA2   |
 |     P2|
 |-------|
In this diagram at least all the currents will return through the device
back to the source through a return path similar to that of the
application.




Boy this sure would be messy... There is probably a better way to do this=

in
simulation...  How about using multiport single ended measurements to ful=
ly
"port-wise" characterize" devices... confirm these results to a model....=

Then take advantage of the simulator, install an empirically confirmed
models... Is it possible to create non-ground referenced (i.e. amplifier =
to
be referenced to a lossy return path)  differential amplifier models?

Depending on how they work, those "no-ground" ports could come in handy
here!

Too many random thoughts....  [richochet_rabbit_mode=3Doff]

_gus

How many of you will be at DesignConn???  How about a pizza, beer, and
differential s-parameters evening (or two) to set up a plan to figure thi=
s
out?


-----Original Message-----
From: si-list-bounce@xxxxxxxxxxxxx
[mailto:si-list-bounce@xxxxxxxxxxxxx]On Behalf Of Gary Otonari
Sent: Thursday, January 10, 2002 4:15 PM
To: xlzhou@xxxxxxxxx; si-list@xxxxxxxxxxxxx
Subject: [SI-LIST] Re: Differential S-parameters



There is no "true" differential VNA that we know of today, but at GigaTes=
t,
we have been using the Agilent Multiport for Mixed-mode (common and
differential) S-parameter measurements, with good results.    We have don=
e
several correlation experiments to verify that direct TDR measurements
agree with the differential S-parameters (via simulation in ADS).  For a
clear, well written App. Note on the subject of single-ended and
differential S-parameters, which references the Blockelman paper, see
Maxim's App Note #HFAN-510:

http://pdfserv.maxim-ic.com/arpdf/AppNotes/4hfan510.pdf

We'll be discussing differential measurements, including the Agilent 4-po=
rt
VNA, several times in public during the month of January.  I'll send a
separate note to the list, with our upcoming schedule of events....

-- Gary

=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D

"Zhou, Xingling (Mick)" wrote:

> Dennis,
>
> Sorry for the errors. It should be
>
> MTT-Vol.45,No.7,1997,pp.1071-1077.
>
> The title is "Pure-Mode Network Analyzer for On-Wafer Measurements of
> Mixed-Mode S-Parameters of Differential Circuits" by David E. Blockelma=
n
> etc.
>
> Thanks for pointing it out.
>
> Mick
>
> -----Original Message-----
> From: Dennis Rehm [mailto:drehm@xxxxxxxx]
> Sent: Thursday, January 10, 2002 2:32 PM
> To: xlzhou@xxxxxxxxx
> Subject: Re: [SI-LIST] Re: Differential S-parameters
>
> I looked on the MTT web site and did not find the article that you
> mentioned below. The pages in No. 1 start at 1, the july issue has page=
s
> in the 1000 to 1100 range but no article starting on page 1071.  What i=
s
> the title of the paper?
>
> Thanks
>
> Dennis
>
> "Zhou, Xingling (Mick)" wrote:
>
> > Hi,
> >
> > We have exactly the same concern.
> >
> > I use the formulas published in MTT-Vol47,No.1,1999,pp.1071-1077. The=

> > authors proposed PMVNA system. I do not know any commericial one.
> >
> > Furthermore, how does the "Network Analyzer with Ungrounded Ports
> > (SP_Diff.)" in Agilent ADS
> > work in this case? I mean, are the definitions consistent?
> >
> > Mick
> >
> > -----Original Message-----
> > From: Zabinski, Patrick J. [mailto:zabinski.patrick@xxxxxxxx]
> > Sent: Thursday, January 10, 2002 9:23 AM
> > To: si-list@xxxxxxxxxxxxx
> > Subject: [SI-LIST] Differential S-parameters
> >
> > In the past few years, we've seen a tremendous surge
> > in the application of differential signaling, and we
> > do not expect the trend to end anytime soon.
> >
> > In our lab, we like to characterize our devices, both
> > active and passive, with S-parameters.  We feel S-parameters
> > give us MUCH useful information.
> >
> > However, making differential S-parameter measurements
> > takes us a considerable amount of effort, requiring
> > a series of baluns, switches, etc., all manually
> > controlled/installed.
> >
> > Is there a commercial piece of equipment on the market
> > (or being developed) that makes truly differential S-parameters.
> >
> > I am aware of the ATN/Agilent system that takes single-ended
> > measurements and mathematically converts the results to
> > differential, but for active/non-linear devices, I believe
> > we really need a truly-differential capability.  Does such
> > a beast exist?
> >
> > Thanks,
> > Pat
> >
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Subject: [SI-LIST] Re: Differential S-parameters
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