Dear Dima, I will call your attention to page 18 of the DesignCon 2002 program available on the web. http://www.designcon.com/2002/catalog.pdf http://www.atspeedtechnologies.com/ "HP-TF1 Monday, January 28 9:00 am - Noon High-Performance System Design Conference "Measurement-Based Design Series: Re-Examining the New Limits for High Speed on Copper "Henri Merkelo, Chief Executive Officer, Ultrahigh Speed Electronics, atSpeed Technologies Timothy Hochberg, Technical Staff, atSpeed Technologies in collaboration with ERNI Components and Agilent Technologies." I cannot understand what your basis is for impugning my honesty. For you= r information, ERNI Components, Inc has been funding a significant portion of Dr. Merkelo's research for the past year. We are paying his airfare, hotel and meals so that he can present information relating to t= he high speed characterization of interconnect systems at DesignCon 2002. = In addition, his method of extracting S21 was validated in his two papers= last year one which was co-authored by Agilent and one that was co-authored by Compaq Computers. In the two DesignCon papers just mentioned, this method was compared to the following methods: VNA with balun to 2 Gigahertz ATN Microwave 4001 to 6 Gigahertz TDT Extraction to 10 Gigahertz (what I am referring to) ATN Microwave 4002 to 20 Gigahertz If you are going to cast aspersions on the technical veracity of my comments, please back up your casual "pot shots" in some way that will advance the understanding of the subscribers to this reflector. Here are the titles of the papers that were given: DesignCon 2001: HP-09A "Broadband Measurements in the Differential Mode" Accurate Determination of Dispersive Attenuation. T. Hochberg, H. Merkelo= , J. Grebemkemper, G. Kimitsuka, D. Vermeersch. DesignCon 2001: HP-05: "Advances in High-Speed Design in Dispersively Attenuating environments Such as Cables and Backplanes. T. Hochberg, H. Merkelo, M. Resso. I am sure we would all be more interested in comments that would address the subject in a more useful way. I believe that the additional ability = of the Oculus (tm software) to be able to convert import direct VNA measurements in Agilent Touchstone (tm) format and export composite circuits from Oculus in Agilent Touchstone (tm) format make this a particularly useful method that lends itself to a rigorous examination. = The ability to reproduce actual measurements taken with an Agilent 86100 Digital Scope and an Anritsu Pulse Generator, within the Oculus-Cascade workbench with mathematical modeling based on measurement based models wi= ll be interesting to those attending the TechForum session on Monday January= 28th. = We look forward to your questions at that time. http://www.atspeedtechnologies.com/ michael munroe = TeamZD Coordinator The ERNI Group "A Copper Alliance Partner." Chester, Virginia 804-240-7188 www.teamZD.com www.erni.com Message text written by "Dima Smolyansky" >Hello, I think one important part that this author is missing is that Pat Zabins= ki was asking for "true" differential S-parameters measurement, not conversi= on of single-ended measurements into differential. Henri Merkelo's software would not be accurate as "true" differential S-parameter computation, sin= ce it is based on not true differential initial data, but conversion of single-ended into differential. Also, since Patrick seem to be interested= in non-linear active (active is the key word) device characterization, in th= is case getting S-parameters from TDR does not seem to be the best thing, as= TDR has not been widely used for active device characterization. We come across these questions about TDR all the time, and people believe it may = be possible to do active device characterization with a DC blocking capacito= r, but nobody seems to have done it. Another important (although non-technical) point that the author is missi= ng is that it is inappropriate to mislead this newsgroup. None of DesignCon forums or papers is sponsored by anybody - at least not any more than any= technical paper at a technical conference can be - they can only be co-authored. I know this because we have a TecForum and a paper at DesignCon ourselves (and our paper and TecForum will deal with exactly some of the technical issues analyzed above). Furthermore, ERNI is nowhere on DesignCon co-sponsor and nobody from ERNI is on a co-author list, to the best of my knowledge. I hope Mr. Monroe just mis-spoke accidentally. Thanks, =3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D Dima Smolyansky Time Domain Analysis Systems, Inc. 11140 SW Barbur Blvd., Suite 100 Portland, OR 97219 (503) 246-2272 (503) 246-2282 (fax) (503) 804-7171 (mobile)< ------------------------------------------------------------------ To unsubscribe from si-list: si-list-request@xxxxxxxxxxxxx with 'unsubscribe' in the Subject field or to administer your membership from a web page, go to: //www.freelists.org/webpage/si-list For help: si-list-request@xxxxxxxxxxxxx with 'help' in the Subject field List archives are viewable at: //www.freelists.org/archives/si-list or at our remote archives: http://groups.yahoo.com/group/si-list/messages Old (prior to June 6, 2001) list archives are viewable at: http://www.qsl.net/wb6tpu