[SI-LIST] Re: Determination of relative permittivity

Matthias,
The NIST publication on Dk/Df characterization is Technical Note 1520. It
give a very good overview of the measurement methods for Dk/Df. You can also
check DesignCon 2003 TecForum HP-TF2. I published a paper with Istvan Novak
that describes a modification of the full-sheet resonance (FSR) method. (See
NIST tech note NISTIR 5053). The modified FSR method measures Dk (very
consistently) from fabricated PCB's and we are currently using the method to
characterize a wide range of both PCB core laminate and prepreg materials.

Depending on the dielectric constant of your material you may be able the
fabricate a PCB plane resonance cavity with the dimensions that will
resonant from 200 to 500 MHz in discrete frequency points depending of the
length of the cavity.

Nick Biunno
Sanmina-SCI

-----Original Message-----
From: Matthias Bergmann [mailto:matthias-bergmann@xxxxxx]
Sent: Wednesday, May 25, 2005 4:32 PM
To: si-list@xxxxxxxxxxxxx
Subject: [SI-LIST] Determination of relative permittivity 


Hello,

quite a lot of discussions deal about the (effective) permittivity, but how
do I determine it ?
I would like to measure the complex permittivity of synthetic materials in
a frequency range between 1 till 500 MHz. I know there are methods like
Parallel plate,
Reflection wave, S Parameters or Cavity  to measure it, but, it's sort of
weird, 
I didn't find any paper which explains how to construct a measurement
system.
So, are there any basic papers or books you can recommend me ?

Best regards, Matthias Bergmann

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