My 2-cents: 1-from memory-schmoo data, u find out which byte lane is the worst and wether it is read or write marginality. 2- pls look @ the eye-diagrams of bits within the worst-byte lane: assuming the schmoo-data is saying that data bus is the marginal one. 3-based on # 1 and 2: try to root-cause the marginality in the eye-diagram by extracting the layout for the DQ signal u probed with a tool such as Momentum or HFSS to get the S-parameters: it is highly recommended to extract the whole byte lane: all eight DQ signals and then also DQS. I personally recommend Momentum as it is accurate and fast in getting S-parameters with models for impedance, X-talk, return-path discontinuity if signals are making transistion along with stitching and proximity of the stitching. 4-after getting S-parameter model, u can correlate the model with TDR simulations vs TDR measurements of the bare-PCB. 5-run first PRBS linear driver model to find-out the marginality is coming from the layout (passive interconnects) or it is coming from the drivers and/or receivers. 6-get accurate models of the drivers/receivers, highly recommend encrypted transistor models from Micron and also from Virtex. Then run eye-diagram simulations and try to correlate with eye-diagram measurements. 6-from 4 and 5 above, u will find out whether it is a layout problem, or driver/receiver or settings of the driver Ron/SR or termination ODT, or is it the SSO noise on the brd, or is it the Vref signal, u may want also to measure the Vref signal and see the amount of noise on it and also extract it on the brd using Momentum and run the bye lane and see how much sso noise is coupled to Vref. Above methodology depends on the handshaking between lab and simulations to root-cause the problem, then optimize a solution space. Parameters to optimize: 1-width/spacing of the DQ signals. Which impact the impedance and X-talk. 2-layers of routing and transitions along with stitching and proximity of stitching. 3- driver and receiver Ron, ODT, SR optimization. 4-vref signal routing optimization or the optimization of the set-point of Vref. Hany Fahmy 4- ----- Original Message ----- From: si-list-bounce@xxxxxxxxxxxxx <si-list-bounce@xxxxxxxxxxxxx> To: charlene radtke <chuckiesanchez@xxxxxxxxx> Cc: si-list@xxxxxxxxxxxxx <si-list@xxxxxxxxxxxxx> Sent: Sun Jan 31 12:56:20 2010 Subject: [SI-LIST] Re: DDR2 to Virtex 5 heating up and a few other questions Charlene, there are already some good responses. My question to you is where are you with respect to your power demand and thermal analysis? If you have not done them yet, late is better than never. Just a summary list of things that can impact your consumption, some already mentioned: Driver selection: DCI enabled will greatly increase consumption over disabled. SSTLxx Type 2 w/ DCI is particularly power hungry. The removed series resistors will aggravate the difference between the two designs. LDO selection: 2 quadrant operation is required for Vtt. If your LDO is single quadrant, then the terminators in the FPGA will dissipate more depending on data pattern. Timing. If you have gross errors you could be seeing momentary cross conduction at bus turnaround when going from memory write to read operations. Steve. charlene radtke wrote: > Hello Experts, > I have a Virtex 5 FPGA connected to a Micron DDR2 device running at 180MHz. I > designed a prototype and am now spinning the design for another phase of my > program. Both designs use the same V5 and the only difference between the > DDR2s used in each design is that one if a -3 and the other is a -3E version. > > > These are the differences in the 2 design: > The Layout had some improper return paths set up for Vref and Vtt that > were corrected in the 2nd design. > I had series resistors on all data lines in the prototype that were > removed in the 2nd design. > I used all STTL18 class 1 on all IO in prototype. In the 2nd design I > experimented with STTL18 class 1 and class 2 on control and data lines. (I > read several app notes that mentioned both - and am currently confused on > what is the correct approach) > On both designs, data transfer stops working beyond 180MHz. > On the prototype design, I didn't notice the heat that I am noticing on > the 2nd design. > > During my DDR2 tests, current consumption spikes up to 2.12A from approx > 1.2A as read from the power supplies. > I am using a TI switch regulator to produce 1.8V. > I am using a 0.9v LDO for VTT VREF that is enabled by a seperate FPGA on > the board (not the V5). > > According to the system monitor in the V5, the temperature peaks at about 66 > deg C on the 2nd design (about 10 deg hotter than the prototype design). I'm > not sure if this is an issue with the DDR2 or the V5 but I really want to > understand what could be causing this. I have checked bus contention and have > also tried running DDR2 with various IO standards. > > Any brainstorming assistance and advice is appreciated. > Charlene > > > > ------------------------------------------------------------------ > To unsubscribe from si-list: > si-list-request@xxxxxxxxxxxxx with 'unsubscribe' in the Subject field > > or to administer your membership from a web page, go to: > //www.freelists.org/webpage/si-list > > For help: > si-list-request@xxxxxxxxxxxxx with 'help' in the Subject field > > > List technical documents are available at: > http://www.si-list.net > > List archives are viewable at: > //www.freelists.org/archives/si-list > > Old (prior to June 6, 2001) list archives are viewable at: > http://www.qsl.net/wb6tpu > > > > -- Steve Weir IPBLOX, LLC 150 N. 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