Hi Everyone, The combination of a problem a client of mine had plus a recent news story prompted me to write my latest Technical Tidbit for July about cell phones having the ability to destroy nearby devices such as an automotive "smart key." The title of the article is "Mobile Phone Induced Circuit Failure." Abstract: Cases of circuit failures caused by mobile, or cell, phones are starting to be reported. A brief overview of the problem is given followed by a simple test procedure to gauge the risk to a product. Go to http://emcesd.com and click on the picture of a car key at the bottom of the page to read the article. Doug -- ------------------------------------------------------------ ___ _ Doug Smith \ / ) P.O. Box 1457 ========= Los Gatos, CA 95031-1457 _ / \ / \ _ TEL/FAX: 408-356-4186/358-3799 / /\ \ ] / /\ \ Mobile: 408-858-4528 | q-----( ) | o | Email: doug@xxxxxxxxxx \ _ / ] \ _ / Web: http://www.dsmith.org ------------------------------------------------------------ ------------------------------------------------------------------ To unsubscribe from si-list: si-list-request@xxxxxxxxxxxxx with 'unsubscribe' in the Subject field or to administer your membership from a web page, go to: //www.freelists.org/webpage/si-list For help: si-list-request@xxxxxxxxxxxxx with 'help' in the Subject field List technical documents are available at: http://www.si-list.net List archives are viewable at: //www.freelists.org/archives/si-list or at our remote archives: http://groups.yahoo.com/group/si-list/messages Old (prior to June 6, 2001) list archives are viewable at: http://www.qsl.net/wb6tpu