Hello!
I would like to get comment on my approach to get the smallest
possible (but still useful) patch amount for
quick profiling of news print offset press. My motivation is to be
able to profile press with small amount of
patches that can be printed during normal press run (without need for
common test-chart print run).
Patches should be printed in border (cut off) area of paper so
probably I could only print some 50 to 100 patches.
The approach I'm considering is to first (and only once) print really
big test chart (4000 to 5000 patches) and measure it.
After that I could use "splitcgats" to get fraction of those
measurements, create profile with that fraction and use "profcheck"
against the whole set to get dE for that set. I can repeat
"splitcgats" 500 or 1000 times to get statistically good representation.
I could repeat same test for 2 or maybe 3 different papers to se if
patch set is more or less the same for them.
I have the ability to use Xgrid consisting of 20+ IMac's so the speed
is not the main concern.
The script I would feed to the grid is something like that..
#!/bin/bash number=$1 cgatsin=$2 cgatsout=$3 splitcgats -n25 -r $number "$cgatsin" "$cgatsout$number.ti3" /dev/null profile -qm -B "$cgatsout$number" profcheck -k "$cgatsin" "$cgatsout$number.icc"
Best Regards Andrej Javorsek