FreeLists / si-list / [SI-LIST] R: Re: Trace Width and Skin Effect Loss

[<gianguida@xxxxxxxx>]

hi folks, 
Maxwell SV
a quite accurate but free tool to analyse such 
a problem is available at  http://www.ansoft.com/downloads.cfm
 
it will alow to analyse the skin depth and trace width effects
 
Regards
Giancarlo
________________________________

Da: si-list-bounce@xxxxxxxxxxxxx per conto di Yuriy Shlepnev
Inviato: gio 11/10/2007 23.17
A: j.jebakumarsamuel@xxxxxxxxxxxxx; si-list@xxxxxxxxxxxxx
Oggetto: [SI-LIST] Re: Trace Width and Skin Effect Loss



Hi Jebakumar,

There are no simple equations to estimate losses in differential microstrip
lines over a wide frequency band. Skin-effect in microstrip lines for
instance is not separable from the edge and proximity effects and from the
dielectric loss. Strip edges and dielectric polarization change the current
distribution in the strip and hence the conductor-related loss. This effect
causes faster than sqrt(frequency) growth of the conductor-related losses
with frequency. Additional factor that contributes to faster growth of loss
with frequency is roughness. See a simple investigation of losses for single
and differential microstrip lines in
http://www.simberian.com/Papers/LossesInMicrostripLine.pdf.

Best regards,
Yuriy

Yuriy Shlepnev
Simberian Inc.
www.simberian.com

-----Original Message-----
From: si-list-bounce@xxxxxxxxxxxxx [mailto:si-list-bounce@xxxxxxxxxxxxx] On
Behalf Of J.Jebakumar Samuel
Sent: Thursday, October 11, 2007 1:55 AM
To: si-list@xxxxxxxxxxxxx
Subject: [SI-LIST] Trace Width and Skin Effect Loss

Hi All,
What is the relation ship between trace width (differential) and skin effect
loss?

Jebakumar Samuel
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