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[SI-LIST] Some Querries regarding Xtalk in traces
- From: Anshuli Goel <anshuli@xxxxxxxxxxxx>
- To: "si-list@xxxxxxxxxxxxx" <si-list@xxxxxxxxxxxxx>
- Date: Tue, 08 Oct 2002 16:43:02 +0530
Hello SI experts
I am a new user of this list. I have a few querries.
I did some simulations in SPEED2000 for observing the coupled voltage
magnitude between traces. For this I had 2 kind of package structures,
One with thick plane ~ 100 micron and dielectric width ~ 25 micron
Other one is plane thikness ~ 20 micron and dielectric width as 100
micron
I observed the coupled voltage peak was less in first case . Why is it
so ?
Also the induced voltage seems to be saturating beyond a separation
?
Regards
Anshuli
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