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[SI-LIST] Some Querries regarding Xtalk in traces

  • From: Anshuli Goel <anshuli@xxxxxxxxxxxx>
  • To: "si-list@xxxxxxxxxxxxx" <si-list@xxxxxxxxxxxxx>
  • Date: Tue, 08 Oct 2002 16:43:02 +0530
Hello SI experts


I am a new user of this list. I have a few querries.

I did some simulations in SPEED2000 for observing the coupled voltage
magnitude between traces. For this I had 2 kind of package structures,

One with thick plane ~ 100 micron and  dielectric width ~ 25 micron
Other one is plane thikness ~ 20 micron and dielectric width as 100
micron

I observed the coupled voltage peak was less in first case . Why is it
so ?


   Also the induced voltage seems to be saturating beyond a  separation
?

Regards
Anshuli


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