FreeLists / si-list / [SI-LIST] Feb-2005 IEEE-EMCS Santa Clara Valley chapter meeting

[Ahmad Fallah <emcesd2000@xxxxxxxxx>]

Hello All,

 

Please join us for the next meeting of the IEEE-EMCS Santa Clara Valley 
chapter, tomorrow 2-8-05.  

 

The meeting will start at 5:30 PM with a social that includes food and 
beverages.  All chapter business and other announcements (e.g., position 
openings) will precede the technical presentation due to start at 7:00 PM.

 

The speaker for this meeting is Mr. Douglas C. Smith.  The meeting schedule and 
the presentation abstract are attached below.

 

Membership in either the IEEE or EMCS is not required to attend this meeting, 
so please join us if you are in the area. We look forward to visiting with you 
during the meeting. 

 
 
 

IEEE/EMC Society Meeting
February 8, 2005 
Time:     Social 5:30 p.m.  Presentation 7:00 p.m. 

 

Place:     Applied Materials Bowers Cafeteria

3090 Bowers Ave., Santa Clara, CA 95051-0804

 

 

Subject: "Locating ESD and other Impulsive Events by Time of Arrival."

    

Speaker:  Douglas C. Smith 

 

Abstract: Now that fast digital scopes are widely available, it is now 
practical to locate impulsive events using a few simple handmade antennas and 
looking at time delays of the wavefront. Examples will be discussed and a live 
demonstration given.

 

About the Speaker:

Mr. Smith held an FCC First Class Radiotelephone license by age 16 and a 
General Class amateur radio license at age 12. He received a B.E.E.E. degree 
from Vanderbilt University in 1969 and an M.S.E.E. degree from the California 
Institute of Technology in 1970. In 1970, he joined AT&T Bell Laboratories as a 
Member of Technical Staff. He retired in 1996 as a Distinguished Member of 
Technical Staff. Recently, he was Manager of EMC Development and Test at Auspex 
Systems in Santa Clara, CA and is now an independent consultant. Mr. Smith is a 
Senior Member of the IEEE and a member of the IEEE EMC Society Board of 
Directors. 

His technical interests include high frequency effects in electronic circuit 
design, including topics such as signal integrity, design reliability, 
Electromagnetic Compatibility (EMC), Electrostatic Discharge (ESD), Electrical 
Fast Transients (EFT), and other forms of pulsed electromagnetic interference. 
He also has been involved with FCC Part 68 testing and design, telephone system 
analog and digital design, IC design, and computer simulation of circuits. He 
has been granted over 15 patents, several on measurement apparatus. 

Mr. Smith has lectured at Oxford University, the University of California at 
Berkeley, Vanderbilt University, AT&T Bell Labs, and at many public and private 
seminars on high frequency circuit design, troubleshooting, measurements, ESD, 
and EMC. He is author of the book High Frequency Measurements and Noise in 
Electronic Circuits. He maintains a practical engineering website at 
http://www.dsmith.org containing nearly 100 useful technical articles. 

 

Kind regards,

Oscar Fallah

Secretary, IEEE-EMCS SCV Chapter

Chair, IEEE-EMCS ESAC Student Design Competition

 




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